Verification of FPGA Encryption Protection Design Based on Laser Injection

CAI Ying; ZHU Xiang; WANG Jian; LI Hao-yuan; HAN Jian-wei

doi:10.12263/DZXB.20210119

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Verification of FPGA Encryption Protection Design Based on Laser Injection

PAPERS | 更新时间：2025-12-08

- Verification of FPGA Encryption Protection Design Based on Laser Injection
- ACTA ELECTRONICA SINICA Vol. 50, Issue 10, Pages: 2381-2386(2022)
- 作者机构：
  
  1.中国科学院国家空间科学中心，北京 100190
  2.中国科学院大学，北京 100049
  3.中国科学院软件研究所，北京 100190
- 作者简介：
- 基金信息：
- DOI：10.12263/DZXB.20210119
  CLC： TP309;
- Received：18 January 2021，
  
  Revised：2021-08-29，
  
  Published：25 October 2022
- 稿件说明：
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蔡莹,朱翔,王舰等.基于激光注入的FPGA加密防护设计验证研究[J].电子学报,2022,50(10):2381-2386.

CAI Ying,ZHU Xiang,WANG Jian,et al.Verification of FPGA Encryption Protection Design Based on Laser Injection[J].ACTA ELECTRONICA SINICA,2022,50(10):2381-2386.
蔡莹,朱翔,王舰等.基于激光注入的FPGA加密防护设计验证研究[J].电子学报,2022,50(10):2381-2386. DOI： 10.12263/DZXB.20210119.

CAI Ying,ZHU Xiang,WANG Jian,et al.Verification of FPGA Encryption Protection Design Based on Laser Injection[J].ACTA ELECTRONICA SINICA,2022,50(10):2381-2386. DOI： 10.12263/DZXB.20210119.

摘要

激光注入技术是评估安全芯片抗故障攻击能力的重要手段之一.本文详细分析了激光故障注入的原理及激光诱发现场可编程门阵列（Field Programmable Gate Array，FPGA）触发器结构故障的机制，提出了一种FPGA激光注入评测方法.分别采用随机和定点故障注入的方法，对基于FPGA实现的SM2算法的基点等数据进行了篡改，验证了防护设计的有效性.针对28 nm工艺的FPGA，激光能够实现指定字节的单比特故障注入，同时也能实现快速的高覆盖率随机故障注入，是一种精确和高效的安全芯片评测手段.

Abstract

Laser injection technology is one of the essential methods to evaluate the ability of security chips to resist failure attacks. In this paper

the principle of laser fault injection and the mechanism of laser-induced structural failure of FPGA(Fiele Programmable Gate Array) trigger are analyzed in detail

and an evaluation method of FPGA laser injection is proposed. The random and fixed-point fault injection method are adopted respectively to tamper with the basic point data of the SM2 algorithm based on FPGA

and the effectiveness of the protection design is verified. Aiming at the FPGA of 28nm process

the laser can achieve the single bit fault injection of specified byte and perform the fast random fault injection of high coverage rate. It is an accurate and efficient means of safety chip evaluation.

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Keywords

references

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