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西北核技术研究所强脉冲辐射环境模拟与效应国家重点实验室,陕西西安 710024
Received:26 April 2021,
Revised:2021-08-02,
Published:25 March 2023
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崔志同,陈伟,董亚运等.kA级脉冲电流注入环的SPICE电路模型[J].电子学报,2023,51(03):632-638.
CUI Zhi-tong,CHEN Wei,DONG Ya-yun,et al.SPICE Circuit Model of the kA Pulsed Current Injection Probe[J].ACTA ELECTRONICA SINICA,2023,51(03):632-638.
崔志同,陈伟,董亚运等.kA级脉冲电流注入环的SPICE电路模型[J].电子学报,2023,51(03):632-638. DOI: 10.12263/DZXB.20210535.
CUI Zhi-tong,CHEN Wei,DONG Ya-yun,et al.SPICE Circuit Model of the kA Pulsed Current Injection Probe[J].ACTA ELECTRONICA SINICA,2023,51(03):632-638. DOI: 10.12263/DZXB.20210535.
在考核电力/电子设备抗强电磁脉冲性能的千安培(kA)级脉冲电流注入试验中,注入环通过感性耦合的方式将脉冲源输出能量加载到受试设备端口,是注入试验平台的重要组成部分.为解决kA级电流注入环的时域电路仿真难题,本文以Montena IC3B型注入环为例,采用多段集总参数电路串联的方法,建立了考虑分布参数因素的kA级注入环SPICE(Simulation Program with Integrated Circuit Emphasis,SPICE)电路模型;并依据注入环磁芯材料特性,对端口阻抗测试数据进行了分频段拟合,采用粒子群优化算法求取了电路模型参数;最后将该模型应用于kA级脉冲电流注入平台的整体电路仿真,并进行了实验验证,结果表明该模型具有较高的时域仿真精度,可用于电力/电子设备强电磁脉冲电流注入试验的设计、分析、效果预估等工作.
In the kA pulsed current injection test to evaluate the anti-strong electromagnetic pulse performance of electric/electronic equipment
the injection probe can load the pulse generator energy to the port of the tested equipment through inductive coupling
which is an important part of the injection test platform. In order to solve the time-domain circuit simulation problem of kA-level current injection probe
taking Montena IC3B injection probe as an example
the paper develop a SPICE (Simulation Program with Integrated Circuit Emphasis) model with series of lumped parameter circuit. According to the material characteristics of the injection probe
the input impedance measurement data is fitted in frequency band
and the circuit model parameters are obtained by particle swarm optimization algorithm. Finally
the model is applied to the complete circuit simulation of the kA pulse current injection platform
and the experimental results show that the model has high time-domain simulation precision and can be used in the design and analysis of the high electromagnetic pulse current injection test of electric/ electronic equipment.
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