Research on Single-Event Radiation Characteristics of an 8-Gbps SerDes in a 28nm CMOS Technology

WEN Yi; CHEN Jian-jun; LIANG Bin; CHI Ya-qing; HUANG Jun

doi:10.12263/DZXB.20211691

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Research on Single-Event Radiation Characteristics of an 8-Gbps SerDes in a 28nm CMOS Technology

PAPERS | 更新时间：2025-12-08

- Research on Single-Event Radiation Characteristics of an 8-Gbps SerDes in a 28nm CMOS Technology
- ACTA ELECTRONICA SINICA Vol. 50, Issue 11, Pages: 2653-2658(2022)
- 作者机构：
  
  国防科技大学计算机科学学院，湖南长沙 410073
- 作者简介：
- 基金信息：
- DOI：10.12263/DZXB.20211691
  CLC： TN402
- Received：23 December 2021，
  
  Revised：2022-07-09，
  
  Published：25 November 2022
- 稿件说明：
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文溢,陈建军,梁斌等.28nm CMOS工艺8-Gbps SerDes单粒子辐射特性研究[J].电子学报,2022,50(11):2653-2658.

WEN Yi,CHEN Jian-jun,LIANG Bin,et al.Research on Single-Event Radiation Characteristics of an 8-Gbps SerDes in a 28nm CMOS Technology[J].ACTA ELECTRONICA SINICA,2022,50(11):2653-2658.
文溢,陈建军,梁斌等.28nm CMOS工艺8-Gbps SerDes单粒子辐射特性研究[J].电子学报,2022,50(11):2653-2658. DOI： 10.12263/DZXB.20211691.

WEN Yi,CHEN Jian-jun,LIANG Bin,et al.Research on Single-Event Radiation Characteristics of an 8-Gbps SerDes in a 28nm CMOS Technology[J].ACTA ELECTRONICA SINICA,2022,50(11):2653-2658. DOI： 10.12263/DZXB.20211691.

摘要

本文研究了28nm体硅CMOS工艺下8-Gbps通用结构高速并转串/串转并接口（Serializer/Deserializer，SerDes）的单粒子辐射特性，该SerDes由电压模发送器（Transmitter，TX）和相位插值（Phase Interpolation，PI）型接收器（Receiver，RX）组成，通过双指数电流源对整个SerDes的TX和RX进行了单粒子效应仿真，仿真结果表明该SerDes的TX和RX均会发生单粒子瞬态（Single-Event Transient，SET），且主要敏感节点包括：D触发器，采样器和时钟相位插值器.进一步采用脉冲激光对整个SerDes进行了扫描测试，测试结果验证了仿真结论.该研究为抗辐射SerDes的研制提供了重要的理论依据.

Abstract

In this paper

single-event radiation characteristics of an 8-Gbps high-speed Serializer/Deserializer interface(SerDes) is studied in a 28nm bulk CMOS technology. The SerDes

which is composed of a voltage mode transmitter(TX) and a phase interpolating(PI) receiver(RX)

is simulated by a double exponential current source to find the sensitive node

and the simulation results show both the TX and RX appear single-event transient(SET) and the main sensitive nodes of the whole SerDes include D flip-flop

samplers and clock phase interpolators. These sensitive nodes are further verified through pulsed-laser single-event experiment

and the study provides an important theoretical basis for the design of radiation-hardened SerDes.

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references

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Yi WEN

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Related Institution

College of Computer Science， National University of Defense Technology

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