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Review on the Application of Metasurface-Based Impedance Matching Layer for Non-Destructive Testing Signal Enhancement
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    • Review on the Application of Metasurface-Based Impedance Matching Layer for Non-Destructive Testing Signal Enhancement

    • ACTA ELECTRONICA SINICA   Vol. 53, Issue 7, Pages: 2539-2557(2025)
    • DOI:10.12263/DZXB.20241070    

      CLC: TN82;P66
    • Received:28 November 2024

      Revised:2025-05-30

      Published:25 July 2025

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  • HAO Tong, ZHENG Wu-an, LI Xiao-jing. Review on the Application of Metasurface,-Based Impedance Matching Layer for Non,-Destructive Testing Signal Enhancement[J]. Acta Electronica Sinica, 2025, 53(07): 2539-2557. DOI:10.12263/DZXB.20241070

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