The Finite Element Analysis for Reliability of Built-DFH in Magnetic Head

XIAO Xiang-hui; PENG Min-fang; LI Fu-hai; ZHAN Jie; TANG Rong-jun

doi:10.3969/j.issn.0372-2112.2012.10.040

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The Finite Element Analysis for Reliability of Built-DFH in Magnetic Head

更新时间：2025-07-16

- The Finite Element Analysis for Reliability of Built-DFH in Magnetic Head
- Acta Electronica Sinica Vol. 40, Issue 10, Pages: 2140-2144(2012)
- 作者机构：
  
  1. 湖南大学电气与信息工程学院,湖南,长沙,410082
  2. 湖南科技大学物理学院,湖南,湘潭,411201
  3. 日本TDK集团,广东,东莞,523000
  4. 湖南大学电气与信息工程学院,湖南,长沙,410082
  5. 湖南科技大学物理学院,湖南,湘潭,411201
  6. 日本TDK集团,广东,东莞,523000
- 作者简介：
- 基金信息：
- DOI：10.3969/j.issn.0372-2112.2012.10.040
  CLC： TM271+.2
- Published：2012
- 稿件说明：
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XIAO Xiang-hui, PENG Min-fang, LI Fu-hai, et al. The Finite Element Analysis for Reliability of Built-DFH in Magnetic Head[J]. Acta Electronica Sinica, 2012, 40(10): 2140-2144.
DOI：

XIAO Xiang-hui, PENG Min-fang, LI Fu-hai, et al. The Finite Element Analysis for Reliability of Built-DFH in Magnetic Head[J]. Acta Electronica Sinica, 2012, 40(10): 2140-2144. DOI： 10.3969/j.issn.0372-2112.2012.10.040.

摘要

磁头内置DFH控制元件的可靠性设计评估十分重要

目前工艺上多采用经验数据指导的方法

误差十分大

理论上是根据传统流体力学的基本原理

利用Matlab软件实现模拟评估的

由于元件尺寸限制

模拟算法会随着舍入误差的叠加而失效.本文使用ANSYS软件

通过实验获得建立模型的基本参数

选择了合适的单元类型、材料属性

给出了磁头的有限元模型.利用模型对元件进行的寿命预测实验表明

有限元模型分析DFH控制元件的设计可靠性问题是有效的

并且得出以下结论:在50Ω的新型DFH计算结果中

其热效应强度比传统屏蔽层大10%以上

实际的寿命失败样品问题区域都在线路的转角处.

Abstract

The assessment for the reliability design of Built-DFH in Magnetic head is very important.It recurrently uses the empirical data to instruct the production in the craft now.Unfortunately

the error is very large.Theoretically

everybody is simulating the reliability using the Matlab software.Owing to the limit of the cell size

the simulation algorithm will expire along with the rounding error superimposition.This article uses the ANSYS software.The experiment was to establish the basic parameters and select the appropriate cell type

material properties and give the finite element model of the head.The results according to the life prediction using the model above shows

the finite element model is effective.Furthermore

in new DFH in 50Ω

the strength of thermal effects is larger above 10% than the traditional shield.The regions with problems of the actual life failed samples are in the line of the corner.

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