A Technique for IR-Drop Analysis of the Multilayered Power/Ground Networks

WANG Yi; YANG Hai-gang; YU Le; SUN Jia-bing

doi:10.3969/j.issn.0372-2112.2015.12.030

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A Technique for IR-Drop Analysis of the Multilayered Power/Ground Networks

更新时间：2025-07-16

- A Technique for IR-Drop Analysis of the Multilayered Power/Ground Networks
- Acta Electronica Sinica Vol. 43, Issue 12, Pages: 2542-2546(2015)
- 作者机构：
  
  1. 中国科学院电子学研究所可编程芯片与系统研究室,北京,100190
  2. 中国科学院大学,北京,100049
  3. 中国科学院电子学研究所可编程芯片与系统研究室,北京,100190
  4. 中国科学院大学,北京,100049
- 作者简介：
- 基金信息：
  
  National Natural Science Foundation of China (No.61271149)
- DOI：10.3969/j.issn.0372-2112.2015.12.030
  CLC： TP391
- Published：2015
- 稿件说明：
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WANG Yi, YANG Hai-gang, YU Le, et al. A Technique for IR-Drop Analysis of the Multilayered Power/Ground Networks[J]. Acta Electronica Sinica, 2015, 43(12): 2542-2546.
DOI：

WANG Yi, YANG Hai-gang, YU Le, et al. A Technique for IR-Drop Analysis of the Multilayered Power/Ground Networks[J]. Acta Electronica Sinica, 2015, 43(12): 2542-2546. DOI： 10.3969/j.issn.0372-2112.2015.12.030.

摘要

提出了一种电源/地线(P/G)网络压降(IR-drop)静态分析方法.该方法探索了多层金属立体P/G网络结构

通过输入各金属层的坐标和通孔(Via)的工艺规则

分析不同多层金属P/G网络的拓扑结构对IR-drop的影响.实验结果表明

文中方法的压降评估结果与SPICE仿真结果相比有着高度的一致性

平均误差小于0.4%

且算法时间复杂度与通孔数目成线性关系.并且指出中间层金属的拓扑结构对IR-drop的分布和大小有重要影响.

Abstract

This paper presents a method for DC analysis of IR-drop in power/ground (P/G) networks.The proposed method explores three-dimensional structure of multi-layer P/G grids.By inputting the coordinates of each metal layer and the process rules of vias

the proposed method analyzes the impact of different multi-layers P/G grids on IR-drop.Experimental results demonstrate that the method has high consistency with SPICE simulation results.The relative error is less than 0.4% and the time complexity has the linear relation to the number of vias.Moreover

the topology of inter-layers has an important relation to the value and distributions of IR-drop.

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