XU Xiao-bo, ZHANG Lin, WANG Xiao-yan, et al. Review on Early Effect Model of Si and SiGe Transistors and Applications to Circuit Simulators[J]. Acta Electronica Sinica, 2016, 44(7): 1763-1771.
DOI:
XU Xiao-bo, ZHANG Lin, WANG Xiao-yan, et al. Review on Early Effect Model of Si and SiGe Transistors and Applications to Circuit Simulators[J]. Acta Electronica Sinica, 2016, 44(7): 1763-1771. DOI: 10.3969/j.issn.0372-2112.2016.07.035.
Review on Early Effect Model of Si and SiGe Transistors and Applications to Circuit Simulators
As a key factor representing the bipolar transistor characteristics
the Early effect influences the output transconductance
the transfer current
the base transit time
the current gain
the diffusion capacitance
and so on.In this paper
we begin with the primary definition of the Early effect
overview the origin of the Early voltage
the development of the model
and the applications to Si and SiGe circuit simulators
with details as follows:(1) Summarize the basic Early effect model of the Si bipolar transistor
and the introduction into SPICE
then describe the improvement of VBIC model in view of limitations of SPICE.(2) As SPICE and VBIC are unable to describe the introduction of Ge profile into the base
we review the modeling methods of the Early voltage with SiGe HBTs
based on the modeling ideas of Mextram and HICUM
two SiGe HBT standard models.(3)Sum up the strengths and weaknesses of present models for the Early effect.