FAN Li-jing, CHEN Shu-qiang, YAN Yu-jie, et al. Application of Perturbation Method in the Analysis of Diffraction Gratings[J]. Acta Electronica Sinica, 2016, 44(9): 2046-2050.
DOI:
FAN Li-jing, CHEN Shu-qiang, YAN Yu-jie, et al. Application of Perturbation Method in the Analysis of Diffraction Gratings[J]. Acta Electronica Sinica, 2016, 44(9): 2046-2050. DOI: 10.3969/j.issn.0372-2112.2016.09.003.
Application of Perturbation Method in the Analysis of Diffraction Gratings
In the analysis of two-dimension diffraction gratings
rigorous coupled wave analysis (RCWA) takes a long time and a large computer memory.The perturbation method (PM) is combined with RCWA to enhance its computational speed for the analysis of two-dimension structures.In the analysis of the non-rectangular gratings
the grating is approximated by a stack of lamellar gratings.We obtain the eigenvalues of the reference layers by RCWA firstly
and then get the eigenvalues of the rest layers by PM.It shows that PM can shorten the calculation efficiency at the basis of achieving the calculation accuracy.For the simulation example