BU Deng-li, JIANG Jian-hui. Pareto Dominance Based Area and Reliability Optimization of MPRM Circuits[J]. Acta Electronica Sinica, 2016, 44(11): 2653-2659.
DOI:
BU Deng-li, JIANG Jian-hui. Pareto Dominance Based Area and Reliability Optimization of MPRM Circuits[J]. Acta Electronica Sinica, 2016, 44(11): 2653-2659. DOI: 10.3969/j.issn.0372-2112.2016.11.013.
Pareto Dominance Based Area and Reliability Optimization of MPRM Circuits
Area and SER (Soft Error Rate) evaluation models at logic level are proposed for area and reliability optimization of MPRM (Mixed-Polarity Reed-Muller) circuits
the trade-off between area and reliability is achieved by using Pareto dominance based multiobjective optimization.The area is computed by decomposing the XOR part of MPRM circuit as trees of XOR gates and counting in XOR gate sharing among multiple outputs.The SER is computed by using signal probability and fault propagation techniques
and taking into account the logic masking effects and correlations among signals in the circuit network.Based on the proposed area and SER evaluation models
the Pareto optimal set for area and SER of MPRM circuit is obtained by using polarity optimization method with Gray code based exhaustive search strategy
the final solution is selected by using a metric called efficiency factor.Experimental results by using a set of benchmark circuits from MCNC show that
in comparison with the MPRM circuits with minimized area
the selected MPRM circuits have improved reliability with less area overhead.