EMP Susceptibility Modeling and Assessment of Electronic System Based on Hierarchical Bayesian Networks

LIU Yu; HAN Feng; LU Xi-cheng; WANG Jian-guo

doi:10.3969/j.issn.0372-2112.2016.11.019

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EMP Susceptibility Modeling and Assessment of Electronic System Based on Hierarchical Bayesian Networks

更新时间：2025-07-16

- EMP Susceptibility Modeling and Assessment of Electronic System Based on Hierarchical Bayesian Networks
- Acta Electronica Sinica Vol. 44, Issue 11, Pages: 2695-2703(2016)
- 作者机构：
  
  1. 西北核技术研究所第五研究室,陕西,西安,710024
  2. 西安交通大学电子与信息工程学院,陕西,西安,710049
  3. 西北核技术研究所第五研究室,陕西,西安,710024
  4. 西安交通大学电子与信息工程学院,陕西,西安,710049
- 作者简介：
- 基金信息：
  
  Key Fund of National Natural Science Foundation of China (No.61231003);Youth Fund of National Natural Science Foundation of China (No.61201090)
- DOI：10.3969/j.issn.0372-2112.2016.11.019
  CLC： TN07N945.17
- Published Online：25 November 2016，
  
  Published：2016
- 稿件说明：
移动端阅览
LIU Yu, HAN Feng, LU Xi-cheng, et al. EMP Susceptibility Modeling and Assessment of Electronic System Based on Hierarchical Bayesian Networks[J]. Acta Electronica Sinica, 2016, 44(11): 2695-2703.
DOI：

LIU Yu, HAN Feng, LU Xi-cheng, et al. EMP Susceptibility Modeling and Assessment of Electronic System Based on Hierarchical Bayesian Networks[J]. Acta Electronica Sinica, 2016, 44(11): 2695-2703. DOI： 10.3969/j.issn.0372-2112.2016.11.019.

摘要

针对电子系统电磁脉冲易损性评估问题，提出了基于分层贝叶斯网络的电子系统电磁脉冲易损性评估模型建模方法.分析了电子系统分层结构特征及其电磁脉冲效应的特点，应用电磁拓扑理论中的相互作用顺序图分析系统电磁耦合途径，确定系统内底层屏蔽区域节点，研究了相互作用顺序图与系统分层贝叶斯网络的拓扑关联关系，在系统分层贝叶斯网络模型中增加底层屏蔽区域节点层，从而建立系统易损性评估模型，并给出了相应的建模步骤.最后以某电子机械传动系统电磁脉冲易损性评估问题为例说明了建模和计算过程.

Abstract

A modeling method based on hierarchical Bayesian networks (HBN) which can be used in the susceptibility assessment of electronic system interfered by electromagnetic pulse (EMP) is proposed.According to the hierarchical structure of the electronic system and the feature of its EMP effects

steps to assess the system susceptibility are discussed.Analyzing the couple path by using the interaction sequence diagram (ISD)

and the proper volume nodes of the base level of the ISD and the probability distribution of the electromagnetic stress in these nodes are determined.The topology relationship between the HBN and ISD is created by adding the directed arc from the base proper volume nodes of the ISD to the root nodes of HBN.The base proper volume level is considered as new root level to rebuild the HBN of system which can be used as the susceptibility assessment model of electronic system interfered by EMP.A case study demonstrates the effectiveness of the proposed methodology.

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