The clustering-based SoC test scheduling algorithm combined with the asynchronous clock periods testing is proposed to further reduce the SoC(System-on-Chip) test application time (TAT) and test cost.The scheduling algorithm pre-processes the test data by exploiting the characteristics of the tests.After conducting experiments on the ITC'02 SoC benchmark
we find out that the proposed scheduling method based on clustering can reduce TAT by 20.39% and 5.53% on average
when comparing with a synchronous clock testing method and an asynchronous method based on the MILP model
respectively.Besides
when the power constraint is tight
there is only a difference of 0.9% between the scheduling result and the lower bound.