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Remaining Useful Life Prognostic for the Stochastic Degradation Device Subject to Imperfect Maintenance
更新时间:2025-07-16
    • Remaining Useful Life Prognostic for the Stochastic Degradation Device Subject to Imperfect Maintenance

    • Acta Electronica Sinica   Vol. 45, Issue 7, Pages: 1740-1749(2017)
    • DOI:10.3969/j.issn.0372-2112.2017.07.026    

      CLC: TP273
    • Published Online:25 July 2017

      Published:2017

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  • ZHENG Jian-fei, HU Chang-hua, SI Xiao-sheng, et al. Remaining Useful Life Prognostic for the Stochastic Degradation Device Subject to Imperfect Maintenance[J]. Acta Electronica Sinica, 2017, 45(7): 1740-1749. DOI: 10.3969/j.issn.0372-2112.2017.07.026.

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