Implementation of the Dual-Edge Triggered JK Flip-Flop Based on QCA

DU Hua-kun; L; Uuml; Hong-jun; HUANG Cheng

doi:10.3969/j.issn.0372-2112.2017.08.034

您当前的位置：

首页 >

文章列表页 >

Implementation of the Dual-Edge Triggered JK Flip-Flop Based on QCA

更新时间：2025-07-16

- Implementation of the Dual-Edge Triggered JK Flip-Flop Based on QCA
- Acta Electronica Sinica Vol. 45, Issue 8, Pages: 2044-2048(2017)
- 作者机构：
  
  合肥工业大学电子科学与应用物理学院,安徽,合肥,230009
- 作者简介：
- 基金信息：
  
  National Natural Science Foundation of China (No.61271122)
- DOI：10.3969/j.issn.0372-2112.2017.08.034
  CLC： TN402
- Published：2017
- 稿件说明：
移动端阅览
DU Hua-kun, L, Uuml, et al. Implementation of the Dual-Edge Triggered JK Flip-Flop Based on QCA[J]. Acta Electronica Sinica, 2017, 45(8): 2044-2048.
DOI：

DU Hua-kun, L, Uuml, et al. Implementation of the Dual-Edge Triggered JK Flip-Flop Based on QCA[J]. Acta Electronica Sinica, 2017, 45(8): 2044-2048. DOI： 10.3969/j.issn.0372-2112.2017.08.034.

摘要

量子元胞自动机（Quantum-dot Cellular Automata，QCA）是一种有望替代传统半导体晶体管的新型纳米器件.本文提出了一种改进的双边沿触发结构及其相应的JK触发器电路，用概率转移矩阵（Probabilistic Transfer Matrix，PTM）分析该触发结构，结果表明该结构较以往的可靠性更高.同时利用模块垂直堆叠方法来优化了JK触发器电路，新结构电路较之前的电路元胞数和整体面积均有所减少.

Abstract

Quantum-dot cellular automata (QCA) is an emerging nano-device that can be considered as a promising alternative for semiconductor transistor.An improved dual-edge triggered structure and JK flip-flop are proposed.The reliability of the dual-edge triggered structure is higher than that of previous designs through the probabilistic transfer matrix.Furthermore

compared to the previous designs of JK flip-flop

the dual-edge triggered JK flip-flop based on the vertically-stacked block has less cell number and smaller area.

关键词

Keywords

references

Views

下载量

CSCD

Alert me when the article has been cited

提交

Tools

Publicity Resources

Performance Analysis and Design of Full Adder in Quantum-dot Cellular Automata

Design of n-bit Full Adder Based on Quantum-Dot Cellular Automata

A Serial Method of Circuit Reliability Calculation Based on Probabilistic Transfer Matrix

The Design and Application of QCA Full Adder Based on Improved Five-Input Majority Gate

Reliability Estimation of Sequential Circuit Based on Probabilistic Transfer Matrices

Related Author

Hong-jun

Uuml

SUN Meng-bo

ZHANG Hui

XIE Guang-jun

ZHANG Yong-qiang

WANG Zhen

JIANG Jian-hui

Related Institution

School of Microelectronics，Hefei University of Technology

Department of Computer Science and Technology, Tongji University

School of Software Engineering, Tongji University

Faculty of Information Engineering, Jiangxi University of Science and Technology

School of Software Engineering Tongji University Shanghai China

⁰