XIA Chun-yan, ZHANG Yan, WAN Li, et al. Test Data Generation of Path Coverage Based on Negative Selection Genetic Algorithm[J]. Acta Electronica Sinica, 2019, 47(12): 2630-2638.
DOI:
XIA Chun-yan, ZHANG Yan, WAN Li, et al. Test Data Generation of Path Coverage Based on Negative Selection Genetic Algorithm[J]. Acta Electronica Sinica, 2019, 47(12): 2630-2638. DOI: 10.3969/j.issn.0372-2112.2019.12.024.
Test Data Generation of Path Coverage Based on Negative Selection Genetic Algorithm
Path coverage is one of the most important testing methods in the field of software testing. It is a challenging problem to find a set of test data to satisfy the path coverage in the search space. Therefore
automatically generating test data is a key issue in software testing. In this paper
a generation method of test data based on the negative selection genetic algorithm is proposed. The negative selection strategy is integrated into the genetic algorithm
and the population data of the genetic algorithm is dynamically optimized
and the test data covering the target path is automatically generated. The experimental results show that compared with the random method and the genetic algorithm
the proposed method can improve the path coverage and reduce the generation of redundant test data.