WEN Jia, WANG Hong-jun, DENG Jia, et al. Abnormal Event Detection Based on Deep Learning[J]. Acta Electronica Sinica, 2020, 48(2): 308-313.
DOI:
WEN Jia, WANG Hong-jun, DENG Jia, et al. Abnormal Event Detection Based on Deep Learning[J]. Acta Electronica Sinica, 2020, 48(2): 308-313. DOI: 10.3969/j.issn.0372-2112.2020.02.013.
Faced with low accuracy of abnormal event detection in complex scenarios
this paper proposes an abnormal event detection based on deep learning in various public scenes and multiple types of anomalies
and the method has been extended to an abnormal event classification method. The neural network model is used to extract features
and the four kinds of abnormal events
such as group divergence aggregation events
group intensive aggregation events
group escape events and catch-up events
are detected and classified. Test the trained model with PKU-SVD-B test set
compared with various methods on the UMN datasets
and verify the algorithm of abnormal event detection based on deep learning proposed in this paper. Under the premise of adapting to different scenarios
various abnormal events are detected. The high accuracy rate indicates that the trained model has strong ability to generalize abnormal event detection.