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Survey on Mutation Testing of Concurrent Programs
更新时间:2025-12-08
    • Survey on Mutation Testing of Concurrent Programs

    • Acta Electronica Sinica   Vol. 48, Issue 11, Pages: 2267-2277(2020)
    • DOI:10.3969/j.issn.0372-2112.2020.11.025    

      CLC: TP311
    • Published Online:25 November 2020

      Published:2020

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  • TIAN Tian, GONG Dun-wei. Survey on Mutation Testing of Concurrent Programs[J]. Acta Electronica Sinica, 2020, 48(11): 2267-2277. DOI: 10.3969/j.issn.0372-2112.2020.11.025.

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Related Author

ZHANG Mei-feng
SHAO Cheng
GAN Yong
LI Mei-juan
TIAN Tian
WANG Miao-miao
LI Cheng-long
GONG Dun-wei

Related Institution

School of Electronic and Information Engineering,Dalian University of Technology
Zhengzhou Institute of Light Industry
School of Electronic and Information EngineeringDalian University of TechnologyDalianLiaoning 116024China
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