LIAO Huai-lin, HUANG Ru, ZHANG Xing, et al. A Direct Extraction Method for the Parameters of Temperature Noise Model[J]. Acta Electronica Sinica, 2001, 29(8): 1126-1128.
LIAO Huai-lin, HUANG Ru, ZHANG Xing, et al. A Direct Extraction Method for the Parameters of Temperature Noise Model[J]. Acta Electronica Sinica, 2001, 29(8): 1126-1128.DOI：
This paper presents a direct extraction method for the associated noise temperature Td and Tg in the MOSFET temperature noise model.The method is related to two-port network noise theory and noise correlation matrix.Td and Tg are extracted from the small-signal model parameters and the noise parameters of the device.It is theoretically shown that the accuracy of extracted Td and Tg in the method is improved.The main factors that affect the accuracy of extracted Td and Tg are systematically analyzed.Comparisons of extracted Td and Tg between the method and other extraction method are presented and a good agreement is shown.
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