High energy density self-healing metallized-film pulse capacitor is the key component of inertial confinement laser fusion facility.Generally

the Weibull distribution model is adopted as lifetime distribution to analyze the capacitor reliability

but the results can not satisfy the demands and the cost of tests is very high.By analyzing degradation mechanism of metallized-film capacitor

this paper uses nonhomogeneous compound Poisson process to describe performance degradation process

and then presents a life distribution model of metallized-film pulse capacitor.Using this model

we can analyze the capacitor reliability through degradation data.This technique can not only assess and verify reliability level of the capacitors but also save tests cost.