南开大学电子系,天津,300071
纸质出版:2009
移动端阅览
刘飞连, 周铁戈, 王定城, 等. 约瑟夫森结参数对Shapiro台阶的影响研究[J]. 电子学报, 2009,37(5):957-960.
LIU Fei-lian, ZHOU Tie-ge, WANG Ding-cheng, et al. Influence of Josephson Junction Parameters on Shapiro Steps[J]. Acta Electronica Sinica, 2009, 37(5): 957-960.
采用PSpice电路仿真的方法
研究了结电容
C
较小的情况下
电阻电容并联约瑟夫森结模型的参数(临界电流
I
c
和正常态电阻
R
n
)对Shapiro台阶高度的影响.发现在射频电流较大的情况下减小
R
n
可以提高台阶的高度
而在射频电流较小的情况下增加
R
n
可以提高台阶的高度.保持
R
n
不变
取不同
I
c
绘制的台阶高度-射频电流幅度曲线表明
临界电流越大
曲线所对应的台阶高度也越大.研究结果对利用约瑟夫森结作为电压标准和THz信号检测具有指导意义.
The simulating model of Josephson junctions in PSpice is constructed and used in the investigation of Shapiro steps.In the condition of little capacitance
we have researched the influence of resistively and capacitively shunted Josephson junction's parameters
including critical current and normal resistance
on Shapiro steps.We found that it can improve the steps by both to reduce the normal resistance under a larger rf-current circumstance and to increase the normal resistance in the condition of a smaller rf-current.We also found that the larger the junction critical current
the higher the Shapiro steps
when the junction resistance keeps constant.The results are of important referential value for the voltage standard and THz signal detection by Josephson junctions.
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