WANG Jie, LIANG Hua-guo, LI Hua-wei, et al. Test Quality Evaluation for Delay Test Pattern Based on Output Violation Probability[J]. Acta Electronica Sinica, 2011, 39(5): 1031-1036.
WANG Jie, LIANG Hua-guo, LI Hua-wei, et al. Test Quality Evaluation for Delay Test Pattern Based on Output Violation Probability[J]. Acta Electronica Sinica, 2011, 39(5): 1031-1036.DOI：
A new test quality evaluation method based on output violation probability to reduce errors induced by hazards is presented.The concept of arrival time window is introduced and the concept of output violation probability is defined to accurately reflecting the pattern capability on SDD detection
which eliminates the errors of probability calculation caused by ignoring hazard.Experimental results show that the proposed evaluation method brings no extra run time overhead
and the selected patterns by this method can achieve higher test quality for SDD detection compared to the previous method based on output-deviation.
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