YU Min, HE Zheng-you, QIAN Qing-quan, et al. Reliability Analysis of Combined Hardware/Software System Based on Markov Process[J]. Acta Electronica Sinica, 2010, 38(2): 473-479.
YU Min, HE Zheng-you, QIAN Qing-quan, et al. Reliability Analysis of Combined Hardware/Software System Based on Markov Process[J]. Acta Electronica Sinica, 2010, 38(2): 473-479.DOI: