Test data and test power are the two major concerns during integrated circuits test.The proposed technique

low power test data compression technique for reconfigurable MUXs network

can effectively reduce test data and test power.The technique made full use of "idle" test channels to reduce test power without compression ratio loss.Under the guide of minimizing power consumption

some "useful" test channels are split

which means some scan chains driven by "useful" channels are adjusted to be driven by "idle" channels.The method

how to select channels and how to split the selected channels

was illustrated.Experimental results show the effectiveness of the proposed technique in reducing average power and peak power.