The high density and large-scale IC meets lots of problems during test

such as huge amount of test data

long test time and so on.This paper presents a full test scheme by using folding test sets.Firstly several folding test sets are generated by random access scan structure in scan cells which are grouped by input reduction technology to detect most of the faults in circuit under test.Then data in scan cells are modified directly to provide test patterns for the remaining faults.The folding test sets are efficient in detecting faults and they need less control information.Experiment results show that it has shorter test time and higher test data compression ratio comparing with other schemas based on RAS.