1. 清华大学电子工程系!北京
2. 100084
纸质出版:1999
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[1]于莉,杜秉初,汪健如,汪荣军.荫罩式彩显管电子束斑测量技术的研究[J].电子学报,1999(06):13-15.
于莉, 杜秉初, 汪健如, et al. The Measurement of the Beam Spot Profile of Shadow Mask CRT[J]. Acta Electronica Sinica, 1999, (6): 13-15.
本文提出了实时地、真实地再现荫罩式彩显管电子束斑的原理和方法;描述了系统的硬件组成;微偏转系统的要求和设计原则;并利用图形相关原理,实现了微偏转系统偏转灵敏度的校准.最后给出了在有荫罩隔离的情况下,在彩显管荧光屏前测出的完美电子束斑.
A method for real-time reconstruction of the beam spot profiles in the shadow mask CRT is proud in this paper. The deflection system that provides the micro tranSlation for the spot reconstruction is described in detail. The method for calibrating the deflection sensitivity is the provided. The original beam spot profile that is separated by the shadoW mask is obtained from the masked beam spot on the screen.
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