In order to solve the problem of low yield by defects in VLSI manufacture

or that of fault tolerance in parallel arrays

we usually employ a redundant repair method supported by laser repair technology. The problem of how to use limited spares to repair a whole faulty array can be described as a cover problem of bipartite graph and was proved NP-hard. In this paper

a new approach is proposed where the concept of independent subgraph is employed in separation of a bipartite graph. Based on this method

a bipartite graph is decomposed into some independent and smaller bipartite subgraphs. Thus the cover problem of bipartite graph becomes that of independent subgraph

so the complexity of the problem is reduced and the analysis time is decreased consequently.