Xia Jun. Measurement of Complex Permittivity of Multilayered Dielectric Samples by means of an Electromagnetic Open Resonator[J]. Acta Electronica Sinica, 1996, (9).
Xia Jun. Measurement of Complex Permittivity of Multilayered Dielectric Samples by means of an Electromagnetic Open Resonator[J]. Acta Electronica Sinica, 1996, (9).DOI：
A new method for the measurement of complex permittivity of multilayered dielectric samples at millimeterwave and submillimeterwave bands by means of an electromagnetic open resonator is proposed. At Ka band an electromagnetic open resonator dielectric measurement system is designed and constructed using a specially machined open resonator set
and measurements on some multilayered dielectric samples are made
the results are in good agreement with the criterion values.
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