1. 清华大学微电子学研究所
2. 香港科技大学电机电子工程系
3. 清华大学微电子学研究所香港科技大学电机电子工程系
纸质出版:1996
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[1]付军,田立林,钱佩信,罗台秦.全耗尽SOI MOSFET的阈电压的解析模型[J].电子学报,1996(05):48-52.
付军, 田立林, 钱佩信, et al. An Analytic Threshold Voltage Model for Fully Depleted SOI MOSFET[J]. Acta Electronica Sinica, 1996, (5).
本文在近似求解全耗尽SOIMOSFET所满足的二维泊松方程的基础上,建立了阈电压的解析模型。通过与PISCES的模拟结果以及相应的实验数据的比较,证明本模型的误差较小。此外,本模型还具有计算简便、快速,形式直观,物理意义明确等优点。本模型的建立对于全耗尽SOIMOSFET电路模拟、器件物理特性研究及相关的工艺设计是很有意义的。
An analytic threshold-voltage model has been established based on the approximate solution of the 2D Poisson’ s equation for the fully-depleted SOI MOSFET. The accuracy of the model is verified by comparison with the simulation results of PISCES and the corresponding experimental data. The model has also such advantages as simple and quick calculation
analytic expression and explicit physical meaning. The establishment of the model is helpful to circuit simulation
study of device physical characteristics and the corresponding process design for the fullydepleted SOI MOSFET.
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