Xue Zhiyong, Li Zhengfan. Electrical Performance of Multiconductor Interconnects for MCM with Perforated Reference Planes[J]. Acta Electronica Sinica, 1996, (3).
Xue Zhiyong, Li Zhengfan. Electrical Performance of Multiconductor Interconnects for MCM with Perforated Reference Planes[J]. Acta Electronica Sinica, 1996, (3).DOI：
A quasi-static approach is demonstrated for the equivalent transmission line characterization of multiconductor interconnects for multichip-module（MCM） with perforated reference planes by using the "method of lines". The proposed method can be used to extract effective transmission line parameters for multiconductor interconnects. The results of some examples are also given.
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