东南大学电子工程系
纸质出版:1995
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[1]蔡益民,孙承休,高中林,魏同立.MIM隧道二极管的发光机理[J].电子学报,1995(02):26-29.
蔡益民, 孙承休, 高中林, et al. Light-Emission Mechanism of MIM Tunneling Junctions[J]. Acta Electronica Sinica, 1995, (2).
本文介绍金属-绝缘体-金属(MIN)结的基本结构及其发光机理,根据电流波动理论计算得到的表面等离子极化激元(SPP)慢模能量分布与测量光谱的比较,得出发光中慢模起主要作用的结论,并以此来说明MIM结I-V特性的负阻现象。
MIM junction’s basic structure and its light-emission mechanism are introduced.We compare the experimental result with the power distribution of SPP slow mode wich is obtained by the current fluctuation theory
and get a conclusion that the slow mode plays the most important role in the light-emission process.At last
we explain the negative resistance phenomenon in MIM junction’s I-V curve with above conclusion.
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