天津大学电子工程系
纸质出版:1994
移动端阅览
[1]赵鸿麟,战长青,潘姬.Si亚微米MESFET的Monte Carlo法模拟[J].电子学报,1994(02):1-7.
赵鸿麟, 战长青, 潘姬. The Monte Carlo Particle Simulation for Submicron Si MESFET[J]. Acta Electronica Sinica, 1994, (2).
本文是继用MonteCarlo法模拟GaAs亚微米器件后,进一步用该法模拟Si亚微米MESFET。文中除了处理Si和GaAs散射机制不同外,在模拟方法上有重要进步:用FFT(FastFourierTransformation)代替迭代法,加速解Poisson方程过程;用快速自散射代替常规自散射,压缩计算无用自散射时间。这些进步相当程度地克服MonteCarlo微粒模拟法费机时的固有缺点。模拟得到的形象且合理的结果,给出亚微米栅长时SiMESFET的性能。
Following the work of the simulation for GaAs submicron device with Monte Carlo particle method
this paper uses the same way to simulate silicon submicron MESFET.In addition to deal with different scattering mechanisms in silicon
advanced concepts and methods
such as FFT(Fast Fouier Transfomation) and fast self-scattering
have been used.It to some extent overcomes the disadvantage of Monte Carlo method.Much computer time has been saved.The results of the simulation demonstrate the performance of silicon MESFET.
0
浏览量
61
下载量
0
CSCD
关联资源
相关文章
相关作者
相关机构
京公网安备11010802024621