武汉邮电科学研究院
纸质出版:1989
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[1]周文俊,李龙勤,阎秀英,李贵吉.Mask测试系统的理论与实验研究[J].电子学报,1989(06):61-64.
Zhou Wen-jun, Li Long-qin, Yan Xiu-ying, et al. The Theoretical and Experimental Study of Mask Measuring System[J]. Acta Electronica Sinica, 1989, (6): 61-64.
本文阐述了关于模场直径(m.f.d)的Petermann第二定义的优越性
介绍了由这一定义建立的远场掩膜测试系统;考虑到掩膜板各部分的实际透过率
修正了国外文献中m.f.d的计算公式
可以迅速、方便、准确地测定1.3μm和1.55μm处单模光纤的m.f.d。
The advantage of the definition for m. f. d (mode field diameter) given by K. Petermann is stated in this paper
and a far-field mask measuring system established accrding to the definition is introduced. Considering the practical transparence of different areas on a mask plate
we have modified the calculation formula of m. f. d given in some foreign literatures. This system can easily be applied to determine m. f. d of monomode fibres at the low-loss wavelength windows of 1.3μm and 1.55μm by means of the formula derived in this paper.
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