本文提出了一种由氧化钛化硅薄膜制成的新型低压电子注入器。测试了样品的I-V特性、电击穿特性、电容特性和光照下电流的变化。试验证明
该样品在较低的电场强度下有较大的电子流注入二氧化硅绝缘层。借助RBS能谱图、X射线结构分析以及SEM照象
对不同的样品的微观结构进行了研究。
A new injector
made of oxidized TiSi2 film and suitable for low voltages (6-10V)
is introduced. Its characteristics are measured. Experiments show that
with this structure
more electrons are injected into the SiO2 under a low electric field. The RBS spectra. X-ray diffration and SEM microphotographs are employed to study the microstructures of the various samples.
0
浏览量
12
下载量
0
CSCD
关联资源
相关文章
相关作者
相关机构
京公网安备11010802024621