碳纳米材料互连线的单粒子串扰特性研究

刘保军; 张爽; 李成

doi:10.12263/DZXB.20210582

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碳纳米材料互连线的单粒子串扰特性研究

学术论文 | 更新时间：2025-12-08

- 碳纳米材料互连线的单粒子串扰特性研究
- Reseach on Single Event Crosstalk Characteristic of Carbon Nanomaterial Interconnects
- 电子学报 2023年51卷第6期页码：1637-1643
- 作者机构：
  
  1.空军工程大学航空机务士官学校,河南信阳 464000
  2.国防科技大学计算机学院高性能计算国家重点实验室,湖南长沙 410073
- 作者简介：
  
  [ "刘保军男，1984年生，山西灵丘人.博士，副教授.主要研究方向为微纳电路系统可靠性、战伤抢修研究." ]
  [ "张爽男，1981 年生，河南信阳人 . 副教授.主要研究方向为可靠性研究、飞机战伤抢修理论与技术研究." ]
- 基金信息：
  
  国家自然科学基金(11975311;11405270)
- DOI：10.12263/DZXB.20210582
  中图分类号： TN406;TN405.97
- 收稿：2021-05-07，
  
  修回：2021-08-10，
  
  纸质出版：2023-06-25
- 稿件说明：
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刘保军,张爽,李成.碳纳米材料互连线的单粒子串扰特性研究[J].电子学报,2023,51(06):1637-1643.

LIU Bao-jun,ZHANG Shuang,LI Cheng.Reseach on Single Event Crosstalk Characteristic of Carbon Nanomaterial Interconnects[J].ACTA ELECTRONICA SINICA,2023,51(06):1637-1643.
刘保军,张爽,李成.碳纳米材料互连线的单粒子串扰特性研究[J].电子学报,2023,51(06):1637-1643. DOI： 10.12263/DZXB.20210582.

LIU Bao-jun,ZHANG Shuang,LI Cheng.Reseach on Single Event Crosstalk Characteristic of Carbon Nanomaterial Interconnects[J].ACTA ELECTRONICA SINICA,2023,51(06):1637-1643. DOI： 10.12263/DZXB.20210582.

摘要

碳纳米材料互连线由于其良好的电学、热学和力学特性，成为研究热点.随着技术节点的缩减，串扰效应对电路的影响愈加显著.本文针对单壁碳纳米管束（Single Walled Carbon Nanotube Bundles，SWCNT）、多壁碳纳米管束（Multi Walled Carbon Nanotube Bundles，MWCNT）、单层石墨烯（Single Layer Graphene Nano-Ribbon，SLGNR）及多层石墨烯（Multi Layer Graphene Nano-Ribbon，MGLNR）的互连线，研究了统一的等效RLC模型，并构建了单粒子串扰（SEC）的等效电路，对比分析了四种互连线在32 nm，21 nm和14 nm技术节点下的SEC峰值电压和脉冲宽度.结果表明，与铜互连线相比，碳纳米材料互连线的SEC较弱，但对传输信号的衰减作用较大，综合信号衰减和耦合作用程度，SWCNT和MLGNR更能有效抑制SEC的传播和影响.最后，本文利用灰色理论，分析了SEC与RLC参数之间的潜在关联性.

Abstract

Due to its well electrical

thermal and mechanical properties

carbon nanomaterial interconnect has become a research hotspot. As devices feature sizes scale down into nano meter

single event transient (SET) becomes the most serious threat for the reliability of integrated circuits (ICs) with advanced process in the future

which should be highly concerned. With CMOS technology scaling continuing and operating frequencies increasing

SET might bring noise into electronically unrelated multiple logic circuit paths due to increased crosstalk effects between interconnects

which can intensify the SET susceptibility of nanometer CMOS circuits. Therefore

single event crosstalk (SEC) effects should be considered carefully in the early design stages of circuits applied for space and ground radiation environments. As technology nodes scaled down

the impact of crosstalk effects on the integrated circuits becomes more and more significant. Although many works have been carried out on the crosstalk effect of carbon nanomaterial interconnects

the conclusions obtained cannot well guide the analysis and research of the radiation effect of integrated circuits of carbon nanomaterial interconnects. For single-walled carbon nanotube bundles (SWCNT)

multi-walled carbon nanotube bundles (MWCNT)

single-layer graphene (SLGNR) and multilayer graphene (MGLNR) interconnects

a unified equivalent RLC model is studied. The equivalent circuit of single event crosstalk (SEC) is built. The SEC peak voltage and pulse width of four interconnects at 32 nm

21 nm and 14 nm technology nodes are compared and analyzed. The results show that

compared with the copper interconnect

the SEC of the carbon nanomaterial interconnects is smaller

but has a greater attenuation effect on the transmission signal. This results in a lower peak voltage and a larger pulse width of SEC. With the technology node scaling down from 32 nm to 14 nm

the peak voltage of SEC tends to increase

and the pulse width of SEC changes insignificantly

except for SWCNT and MLGNR. The peak voltage of SEC in SWCNT interconnect is increased by 2.88 times and the pulse width is reduced by 1.56 times. The peak voltage of SEC in MLGNR is very low

and the pulse width is higher

and almost unchanged. Comprehensive signal attenuation and coupling degree

the performance of SWCNT and MLGNR is better. They can effectively suppress the propagation and influence of crosstalk. Finally

using grey theory

the potential correlation between SEC and RLC parameters is analyzed. The results show that the coupling capacitance and distributed inductance of interconnects will affect the peak voltage and pulse width to a large extent. Therefore

in the early stage of the circuit design

it is necessary to consider how to layout to reduce the coupling capacitance and inductance

thereby reducing crosstalk noise. These results will provide technical supports and ideas for the optimal design and evaluation of carbon nano interconnects applications in radiation dedicated circuits.

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Keywords

references

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