电子科技大学电子科学与工程学院,四川成都 611731
[ "张博 男,1995年出生于河北省衡水市.2019年毕业于电子科技大学电磁场与无线技术专业,获学士学位.现为电子科技大学博士研究生,主修电子科学与技术.主要研究方向为微波/毫米波电路理论与技术,以及毫米波和太赫兹固态电路与系统.E-mail: 2834874954@qq.com" ]
[ "张勇(通讯作者) 男,1975年9月出生于四川省南充市.电子科技大学教授,博士生导师,IEEE高级会员.2004年获电子科技大学博士学位.四川省海外高层次留学人才,入选第十二批电子科技大学“百人计划”,入选第七批国家高层次人才.主要研究方向为微波与毫米波集成电路,以及固态太赫兹技术等.中国电子学会会员编号:E190029499M." ]
[ "江伟佳 男,1998年4月出生于安徽省滁州市.2020级电子科技大学硕士研究生.主要研究方向为包括毫米波/太赫兹集成电路和系统.E-mail: 1349257166@qq.com" ]
[ "刘广儒 男,2000年2月出生于山西省晋中市.现为电子科技大学硕士研究生.主要研究方向为包括毫米波/太赫兹集成电路和系统.E-mail: guangru.liu@qq.com" ]
收稿:2022-11-16,
修回:2023-09-11,
纸质出版:2023-10-25
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张博,张勇,江伟佳等.太赫兹功率放大单片封装技术研究[J].电子学报,2023,51(10):2724-2732.
ZHANG Bo,ZHANG Yong,JIANG Wei-jia,et al.Research on Terahertz Monolithic Integrated Power Amplifier Package[J].ACTA ELECTRONICA SINICA,2023,51(10):2724-2732.
张博,张勇,江伟佳等.太赫兹功率放大单片封装技术研究[J].电子学报,2023,51(10):2724-2732. DOI: 10.12263/DZXB.20221317.
ZHANG Bo,ZHANG Yong,JIANG Wei-jia,et al.Research on Terahertz Monolithic Integrated Power Amplifier Package[J].ACTA ELECTRONICA SINICA,2023,51(10):2724-2732. DOI: 10.12263/DZXB.20221317.
本文对太赫兹功率放大单片封装技术进行研究,主要包括波导-微带垂直过渡和模块内的模式谐振抑制技术.不同于常规的矩形探针平面过渡,本文提出了一种基于分叉探针的垂直过渡结构,适用于多层电路排布的系统/模块封装,并在WR-4波导频段(170~260 GHz)进行了背靠背结构的实验验证,在整个波导频带内,回波损耗优于16 dB,单个过渡的插入损耗约0.42 dB,这包括了波导模块接触不良造成的额外的损耗.为进一步降低过渡损耗,提出了一种开口谐振环结构,用来抑制不良接触导致的电磁泄漏,使过渡损耗降低为原来的一半.此外,为避免功率放大模块内部发生模式谐振,提出将电磁带隙结构设置在平面传输线的上腔来抑制高次模的激励、传输和谐振.应用上述技术对工作于210~230 GHz的功率放大单片进行封装及测试.在210 GHz,小信号增益达到最大值20.75 dB,单端封装损耗约0.8 dB;在217 GHz达到最大输出功率15.6 dBm,与芯片手册数据吻合较好.
In this paper
the packaging technique of terahertz monolithic integrated power amplifier is studied
i.e. waveguide-to-microstrip vertical transition and mode-resonance suppression techniques. Different from the conventional horizontal transition based on rectangular probes
a vertical transition based on a bifurcated probe is proposed
which is suitable for multilayer circuits. To verify the performance
a back-to-back transition is fabricated and measured. In the range of 170~260 GHz
the measured return loss is better than 16 dB
while the single insertion loss
including the loss caused by non-ideal metallic contact
is around 0.42 dB. To further reduce the transition loss
a resonance ring with a slot is proposed to avoid the electromagnetic leakage. As a result
the simulated insertion loss is reduced by half. Moreover
the issue of mode resonance in the amplifier cavity is studied
and electromagnetic band gap structures are set above the plane transmission line to suppress the excitation
transmission and resonance of higher modes. The above techniques are applied to a power amplifier which is operated at 210~230 GHz. In the measurement
the maximum small-signal gain of 20.75 dB and the single packaging loss of 0.8 dB are observed at 210 GHz. At 217 GHz
the maximum output power of higher than 15.6 dBm is achieved
which is consistent with the manual.
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