基于预测兰姆波参考信号的缺陷概率成像

陈晓; 戴杰

doi:10.12263/DZXB.20230878

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基于预测兰姆波参考信号的缺陷概率成像

学术论文 | 更新时间：2025-12-08

- 基于预测兰姆波参考信号的缺陷概率成像
- Probability Imaging for Defects Using Predicted Lamb Wave Reference Signal
- 电子学报 2024年52卷第9期页码：3262-3271
- 作者机构：
  
  1.南京信息工程大学电子与信息工程学院,江苏南京 210044
  2.南京信息工程大学江苏省大气环境与装备技术协同创新中心,江苏南京 210044
- 作者简介：
  
  [ "陈晓男，1974年4月出生，河南邓州人.南京信息工程大学教授，IEEE高级会员，中国电子学会高级会员.在国内外发表学术论文130余篇.主要研究方向为设计、智能信息处理、声信号处理与成像、图像处理.中国电子学会会员编号：E190015856S.E-mail： chenxiao@nuist.edu.cn" ]
  [ "戴杰男，1999 年 2 月出生，江苏泰州人. 南京信息工程大学电子与信息工程学院硕士研究生，主要研究方向为超声信号处理. Email:1332509132@qq.com" ]
- 基金信息：
- DOI：10.12263/DZXB.20230878
  中图分类号： TN98;
- 收稿：2023-09-19，
  
  修回：2024-06-03，
  
  纸质出版：2024-09-25
- 稿件说明：
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陈晓, 戴杰. 基于预测兰姆波参考信号的缺陷概率成像[J]. 电子学报, 2024, 52(09): 3262-3271.

CHEN Xiao, DAI Jie. Probability Imaging for Defects Using Predicted Lamb Wave Reference Signal[J]. Acta Electronica Sinica, 2024, 52(09): 3262-3271.
陈晓, 戴杰. 基于预测兰姆波参考信号的缺陷概率成像[J]. 电子学报, 2024, 52(09): 3262-3271. DOI：10.12263/DZXB.20230878

CHEN Xiao, DAI Jie. Probability Imaging for Defects Using Predicted Lamb Wave Reference Signal[J]. Acta Electronica Sinica, 2024, 52(09): 3262-3271. DOI：10.12263/DZXB.20230878

摘要

针对兰姆波缺陷概率成像需要从材质相同的无缺陷结构获得参考信号的问题，提出一种基于参考信号理论预测的概率成像方法，实现兰姆波缺陷定位.该方法将初始信号和兰姆波的频散特性结合，根据拟合得到的幅值衰减系数计算概率成像路径上的参考信号.根据该方法计算得到的参考信号和对应路径上响应信号的希尔伯特谱定义缺陷表征指数，结合兰姆波椭圆概率成像方法实现缺陷定位.单一缺陷和双缺陷成像定位的实验结果表明，该方法可以得到缺陷的概率图像，对缺陷定位的误差小于7.07 mm，解决了需要测量兰姆波参考信号的问题，定位准确、实用性好.

Abstract

To address the problem that Lamb wave defect probability imaging requires obtaining a reference signal from a non-destructive structures with the same material characteristics

a probability imaging method based on reference signal theoretical prediction was proposed to achieve Lamb wave defect localization. This method combines the initial signal with the dispersion characteristics of Lamb waves

and calculates the reference signal on the probability imaging path based on the fitted amplitude attenuation. The defect characterization index was defined based on the Hilbert spectrum of the calculated reference signal and the corresponding response signal on the path. Combining it with the Lamb wave elliptical probability imaging method achieved defect localization. The experimental results of this method for single- and double-defect imaging localization show that the method can obtain probability images of defects

and the absolute error for defect localization is less than 7.07 mm. This method solves the problem of measuring Lamb wave reference signals and can accurately locate defects

with good practicality.

关键词

Keywords

references

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