一种基于自偏置技术的低功耗低抖动SerDes时钟源锁相环设计

孙欣茁; 林长龙; 丁健平; 赵毅强; 李尧

doi:10.12263/DZXB.20250707

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一种基于自偏置技术的低功耗低抖动SerDes时钟源锁相环设计

学术论文 | 更新时间：2026-06-17

- 一种基于自偏置技术的低功耗低抖动SerDes时钟源锁相环设计
- Design of a Self-Biased Low-Jitter Low-Power Phase-Locked Loop for SerDes
- 电子学报 2026年54卷第4期页码：1903-1915
- 作者机构：
  
  1.天津大学微电子学院，天津 300072
  2.龙芯中科技术股份有限公司芯片研发部，北京 100080
  3.中国科学技术大学微电子学院，安徽合肥 230026
- 作者简介：
  
  孙欣茁女，1989年10月出生于吉林省敦化市。现为天津大学微电子学院博士研究生。主要研究方向为高速电路设计。E-mail: sunxinzhuo@tju.edu.cn
  林长龙男，1988年4月出生于吉林省长春市。现为龙芯中科技术股份有限公司高级工程师。主要研究方向为高速电路技术。E-mail: slideshare@163.com
  丁健平男，1988年12月出生于河南省开封市。现为中国科技大学微电子学院博士研究生。主要研究方向为高速电路设计。E-mail: Emerson.Ding@outlook.com
  赵毅强男，1964年12月出生于河北省石家庄市。现为天津大学微电子学院教授、博士生导师。主要研究方向为混合信号集成电路设计和硬件安全。E-mail: yq_zhao@tju.edu.cn
  李尧男，1995年5月出生于天津市北辰区。现为天津大学微电子学院助理研究员、博士后。主要研究方向为混合信号集成电路设计。E-mail: liyao@tju.edu.cn
- 基金信息：
  
  天津市自然科学基金(24JCQNJC1370)
- DOI：10.12263/DZXB.20250707
  中图分类号： TN492;TN911.8
- 收稿：2025-08-14，
  
  录用：2026-04-01，
  
  纸质出版：2026-04-25
- 稿件说明：
移动端阅览
孙欣茁, 林长龙, 丁健平, 等. 一种基于自偏置技术的低功耗低抖动SerDes时钟源锁相环设计[J]. 电子学报, 2026, 54(04): 1903-1915.

SUN Xinzhuo, LIN Changlong, DING Jianping, et al. Design of a Self-Biased Low-Jitter Low-Power Phase-Locked Loop for SerDes[J]. Acta Electronica Sinica, 2026, 54(04): 1903-1915.
孙欣茁, 林长龙, 丁健平, 等. 一种基于自偏置技术的低功耗低抖动SerDes时钟源锁相环设计[J]. 电子学报, 2026, 54(04): 1903-1915. DOI：10.12263/DZXB.20250707

SUN Xinzhuo, LIN Changlong, DING Jianping, et al. Design of a Self-Biased Low-Jitter Low-Power Phase-Locked Loop for SerDes[J]. Acta Electronica Sinica, 2026, 54(04): 1903-1915. DOI：10.12263/DZXB.20250707

摘要

相比于传统二阶锁相环（Phase-Locked Loop，PLL)结构，自偏置锁相环可在宽动态范围内保持环路稳定性和响应速度不变，具有很高的频率稳定性，可满足各种高精度频率控制应用需求，适合作为满足多协议标准的串行器/解串器（Serializer/Deserializer，SerDes）物理层（PHysical Layer，PHY）电路时钟源使用，在宽频率范围和一定电压范围内具有稳定环路特性。传统自偏置锁相环使用两个电荷泵产生对称辅助电压

fs1

和

fs2

，这会增加系统功耗和面积，并且版图

失配会在

fs1

和

fs2

之间引入静态失配，电路工作过程中电源压降和局部噪声会在

fs1

和

fs2

之间引入动态失配，这些失配会增加压控振荡器的相位噪声和时钟抖动。针对这一问题，本文设计一款低功耗低失配电荷泵结构，由一个电荷泵电路产生

fs1

和

fs2

，该结构通过共用电流偏置部分降低系统功耗，通过设计改进减小输出失配。在实际工作中本设计可同时满足外围组件快速互连（Peripheral Component Interconnect express，PCIe）1.0/2.0/3.0、通用串行总线（Universal Serial Bus，USB）3.0、串行高级技术附件（Serial Advanced Technology Attachment，SATA）1/2/3物理层协议的时钟源要求。SerDes中每4个数据单元共用1个时钟单元，4个数据单元可分别配置成PCIe的任何速率或分别配置成USB及SATA的任何速率。全电路工作在0.9 V低电压下，锁相环面积为0.055 3 mm

，压控振荡器（Voltage-Controlled Oscillator，VCO）的调谐范围是3~5 GHz，环路分频采用6~511分频，输出分频采用1~255分频，输出频率范围是11.76 MHz~5 GHz。后仿真结果表明，锁相环锁定时间2 μs，相位噪声为-110 dBc/Hz@1 MHz，功耗为5.54 mW。测试结果表明，-40~125 ℃范围内2 000片PLL测试成品率大于99%；经过片上长距离传输并通过SerDes发送端所送出高速时钟的抖动测试结果远大于仿真结果，测试结果为2.5 GHz时钟：Random jitter 2.41 ps、period jitter 10.8 ps；4 GHz时钟：Random jitter 1.8 ps、period jitter 9.28 ps。上述高速时钟经过复杂通路送出导致jitter较大，而PCIe插槽上100 MHz参考时钟也由PLL产生，其到输出PAD的路径很短，测试路径引入的抖动较少可直接测试，采用示波器内嵌PCIe参考时钟测试软件对PCIe插槽上参考时钟进行测试，RMS jitter（Root-Mean-Square jitter）最差为0.776 8 ps。为证明本文提出的PLL抖动性能满足SerDes PHY，进行PCIe PHY GEN2速率和GEN3速率测试，所有结果均满足协议要求且Margin很大。

Abstract

Compared with conventional second-order PLL (Phase-Locked Loop)

the self-biased PLL stands out with its remarkable capability to maintain consistent loop stability and response speed across an extensive dynamic range

while also delivering superior frequency stability. These inherent advantages enable it to satisfy the demanding requirements of various high-precision frequency control applications

rendering it an ideal candidate for serving as the clock source of SerDes (Serializer/Deserializer) PHY (Physical Layer) circuits that are compliant with multiple protocol standards. What is more

the self-biased PLL can provide stable loop characteristics not only over a broad frequency range but also within a specific voltage range

which further ex

pands its applicability in complex electronic systems. In traditional self-biased PLL architectures

two separate charge pumps are typically utilized to generate symmetric auxiliary voltages

namely

fs1

and

fs2

. However

this dual-charge-pump configuration inevitably leads to increased system power consumption and a larger chip area footprint

which are critical drawbacks in modern high-density

low-power integrated circuit designs. Additionally

layout mismatches during the manufacturing process can introduce static offsets between

fs1

and

fs2

. To make matters worse

power supply voltage drops and local noise interference that occur during circuit operation will give rise to dynamic mismatches between these two auxiliary voltages. Both static and dynamic mismatches can significantly degrade the performance of the VCO (Voltage-Controlled Oscillator )

manifesting as increased phase noise and clock jitter

which are detrimental to the overall signal integrity of the SerDes PHY system. To tackle the aforementioned issues comprehensively

this paper presents a novel low-power

low-mismatch charge pump structure that is capable of generating both

fs1

and

fs2

using a single charge pump circuit. The core innovation of this design lies in the sharing of the current bias section among the two output voltage branches

which effectively reduces the number of active components and thus cuts down the overall system power consumption substantially. Furthermore

targeted design improvements

such as symmetric circuit layout optimization and precision current mirror calibration

are implemented to minimize the output mismatches between

fs1

and

fs2

thereby mitigating the adverse impacts of static and dynamic offsets on the VCO performance. In practical operation scenarios

the proposed self-biased P

LL design can simultaneously act as the clock source for SerDes PHY circuits adhering to a diverse set of mainstream protocols

including PCIe (Peripheral Component Interconnect express) 1.0/2.0/3.0

USB (Universal Serial Bus) 3.0

and SATA (Serial Advanced Technology Attachment) 1/2/3. A key feature of its application in SerDes systems is that every four data units share one dedicated clock unit

and each of these four data units can be independently configured to operate at any data rate specified by the PCIe protocol

or alternatively

be set to run at any rate supported by the USB and SATA protocols respectively. This high degree of configurability makes the PLL highly adaptable to the heterogeneous communication requirements of modern electronic devices. The full integrated circuit of the proposed PLL operates at a low supply voltage of 0.9 V

which is conducive to low-power operation in battery-powered devices. The chip area occupied by the PLL core is merely 0.055 3 mm²

demonstrating excellent area efficiency that is essential for integration into compact SerDes PHY chips. The PLL achieves a wide frequency tuning range spanning from 3 GHz to 5 GHz for VCO

covering the frequency bands required by most of the targeted protocols. The loop divider supports division ratios from 6 to 511

and the output divider supports ratios from 1 to 255

resulting in an output frequency range of 11.76 MHz to 5 GHz. Post-layout simulation results validate the superior performance of the design: the PLL exhibits a fast locking time of 2 μs

a low phase noise of -110 dBc/Hz at an offset frequency of 1 MHz

and a total power consumption of only 5.54 mW

all of which outperform many conventional self-biased PLL designs. Experimental test results further confirm the robustness and reliability of the proposed PLL. Specifically

the yield rate of 2 000 fabricated PLL chips exceeds 99% when operating within the extreme temperature range from -40 °C to 125 °C

indicating excellent manufacturing compatibility and environmental adapta

bility. Moreover

the jitter test results of the high-speed clock signals transmitted on-chip and output by the SerDes transmitter are significantly larger than the simulation predictions. At an operating frequency of 2.5 GHz

the measured RJ (Random Jitter) is 2.41 ps and the PJ (Period Jitter) is 10.8 ps; when the frequency is increased to 4 GHz

the random jitter is reduced to 1.8 ps and the period jitter is 9.28 ps. The aforementioned high-speed clock incurs significant jitter due to transmission through a complex path. In contrast

the 100 MHz reference clock for the PCIe slot generated by the PLL features an extremely short transmission path to the output PAD

the jitter introduced by the test path is minimal and can be directly measured. A dedicated PCIe reference clock test software embedded in the oscilloscope was adopted to characterize the reference clock at the PCIe slot

with the worst-case RMS (Root-Mean-Square) jitter measured at 0.776 8 ps. To verify the suitability of the proposed PLL structure for SerDes PHY applications

rigorous compliance tests were conducted at PCIe PHY Gen2 and Gen3 data rates. All test metrics not only meet the stringent requirements specified in the corresponding protocol standards but also exhibit ample margins

which provide a solid guarantee for the stable operation of the SerDes system in real-world applications.

关键词

Keywords

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