融合多源信息的维纳过程性能退化产品的可靠性评估

王小林; 郭波; 程志君

doi:10.3969/j.issn.0372-2112.2012.05.018

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融合多源信息的维纳过程性能退化产品的可靠性评估

学术论文 | 更新时间：2025-07-16

- 融合多源信息的维纳过程性能退化产品的可靠性评估
- Reliability Assessment of Products with Wiener Process Degradation by Fusing Multiple Information
- 电子学报 2012年40卷第5期页码：977-982
- 作者机构：
  
  国防科技大学信息系统与管理学院,湖南,长沙,410073
- 作者简介：
- 基金信息：
  
  国家青年自然科学基金 (No.60904002)
- DOI：10.3969/j.issn.0372-2112.2012.05.018
  中图分类号： TB114.3
- 纸质出版：2012
- 稿件说明：
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王小林, 郭波, 程志君. 融合多源信息的维纳过程性能退化产品的可靠性评估[J]. 电子学报, 2012,40(5):977-982.

WANG Xiao-lin, GUO Bo, CHENG Zhi-jun. Reliability Assessment of Products with Wiener Process Degradation by Fusing Multiple Information[J]. Acta Electronica Sinica, 2012, 40(5): 977-982.
王小林, 郭波, 程志君. 融合多源信息的维纳过程性能退化产品的可靠性评估[J]. 电子学报, 2012,40(5):977-982. DOI： 10.3969/j.issn.0372-2112.2012.05.018.

WANG Xiao-lin, GUO Bo, CHENG Zhi-jun. Reliability Assessment of Products with Wiener Process Degradation by Fusing Multiple Information[J]. Acta Electronica Sinica, 2012, 40(5): 977-982. DOI： 10.3969/j.issn.0372-2112.2012.05.018.

摘要

针对维纳过程性能退化产品

提出了一种有效融合先验退化信息、寿命数据以及现场退化数据的可靠性评估方法.首先利用Expectation-Maximization(EM)算法基于先验退化信息和寿命数据信息确定参数的先验分布;其次利用贝叶斯方法对参数进行更新

并在此基础上进行可靠性评估.该方法能根据现场退化数据不断地对可靠性进行更新

实现对产品可靠性的实时评估.最后通过金属化膜电容器可靠性评估实例验证了该方法的适用性和有效性.

Abstract

With respect to Wiener process-degradation products

a method which fused prior degradation information

life data information and current degradation data was proposed to assess their reliability.Firstly

on the basis of the prior degradation information and the life data information

parameters'prior distributions were established by EM method;secondly

by using Bayesian method

prior distributions could be updated to posterior distributions;then the reliability was evaluated based on the posterior distributions.The proposed method can update the reliability evaluation results whenever new degradation data is available

so it is suitable for real-time reliability assessment.Finally

the validity and practical value of this method is verified by an example

relating to reliability assessment of the metallized film capacitor.

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