ZHENG Jian-fei, HU Chang-hua, SI Xiao-sheng, et al. Remaining Useful Life Prognostic for the Stochastic Degradation Device Subject to Imperfect Maintenance[J]. Acta Electronica Sinica, 2017, 45(7): 1740-1749.
ZHENG Jian-fei, HU Chang-hua, SI Xiao-sheng, et al. Remaining Useful Life Prognostic for the Stochastic Degradation Device Subject to Imperfect Maintenance[J]. Acta Electronica Sinica, 2017, 45(7): 1740-1749. DOI: 10.3969/j.issn.0372-2112.2017.07.026.
The current remaining useful life (RUL) prognostic approaches for stochastic degradation device subject to imperfect preventive maintenance suffer from challenge of low accuracy.A new degradation modeling and RUL prognostic approach are proposed considering the effect of imperfect preventive maintenance.First
based on the theory of Wiener process
the stochastic degradation process with the imperfect maintenance is modeled as multi-stage Wiener process.Second
starting with the inverse Gaussian distributed stage time
the lifetime distribution is derived by the convolution property of the inverse Gaussian distribution.Furthermore
the analytical solution of the RUL distribution can be calculated for the stochastic degradation device subject to imperfect preventive maintenance in future.Finally
for verifying the presented approach
a case study for gyros is provided
and the results indicate that the presented approach of this paper can improve the modeling fitting and the accuracy of the estimated RUL.