中国电子技术标准化研究院,北京,100176
网络出版:2018-09-25,
纸质出版:2018
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菅端端, 钟明琛. 下一代光传输系统中超高速ADC芯片性能测试方法[J]. 电子学报, 2018,46(9):2251-2255.
JIAN Duan-duan, ZHONG Ming-chen. Test Method of Ultra-High Speed ADC Performance in Next Generation Optical Transmission System[J]. Acta Electronica Sinica, 2018, 46(9): 2251-2255.
菅端端, 钟明琛. 下一代光传输系统中超高速ADC芯片性能测试方法[J]. 电子学报, 2018,46(9):2251-2255. DOI: 10.3969/j.issn.0372-2112.2018.09.029.
JIAN Duan-duan, ZHONG Ming-chen. Test Method of Ultra-High Speed ADC Performance in Next Generation Optical Transmission System[J]. Acta Electronica Sinica, 2018, 46(9): 2251-2255. DOI: 10.3969/j.issn.0372-2112.2018.09.029.
针对下一代光传输系统对模数转换器(ADC)高采样率、大带宽的要求,提出一种针对该类ADC动态性能的测试方法.通过分析光传输系统中ADC芯片的特点,解决了采样时钟无法直接测量,输出数据难以捕获,分辨率不易统计,插损非线性导致带宽测量偏差等问题,并将该方法应用于光传输、雷达、卫星等高数据率场景所用超高速ADC芯片的评测中.测试结果表明,该方法解决了最高采样率70GSPS带宽16GHz的超高速ADC测试的关键问题,基本满足下一代400Gbps光传输系统对ADC动态性能测试的要求.
This paper presents a set of test methods of analog to digital converter (ADC) dynamic performance
which are used for ADC with high sample rate and large bandwidth in next generation optical transmission system. Based on the analysis of the characteristics of ADC in optical transmission
the following essential problems are solved
including measuring the frequency of sampling clock directly
gathering the output data
calculating the resolution
and correcting the nonlinear error of bandwidth testing. The methods are used in performance evaluation on ultra-high speed ADCs
which are used for high data rate applications
such as optical transmission
radar
satellite
etc. Based on the test results
these methods have solved the key problem of 70GSPS sampling rate 16GHz bandwidth high speed ADC
which can meet the requirement of ADC dynamic performance test used in next generation 400Gbps optical transmission.
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