触发器可靠度计算的F-PTM方法

doi:10.3969/j.issn.0372-2112.2016.09.029

摘要
图/表
参考文献(0)
相关文章 (15)

全文: PDF (1668 KB) HTML (1 KB)
输出: BibTeX | EndNote (RIS)

摘要

传统的概率转移矩阵（PTM）方法是一种用于估计软错误对组合电路可靠度影响的有效方法，但传统PTM方法只适用于组合逻辑电路的可靠度评估.触发器是时序逻辑电路的重要组成部分，其可靠度评估对时序电路的可靠度分析研究至关重要.为此，本文提出了基于PTM的触发器可靠度计算的F-PTM方法及电路PTM的判定定理.F-PTM方法首先建立触发器电路的特征方程，再用电路PTM的判定定理生成触发器的PTM，最后，根据输入信号的概率分布函数计算出电路的可靠度.与传统PTM方法相比较，F-PTM方法既能计算组合电路的PTM，又能计算触发器电路的PTM，其通用性强.对典型的触发器电路和74X系列电路中的触发器电路的实验结果表明，F-PTM方法合理可行.与多阶段方法和Monte Carlo方法的实验结果相比较，F-PTM方法得到的结果更精确.

	服务

	把本文推荐给朋友
	加入我的书架
	加入引用管理器
	E-mail Alert
	RSS
	作者相关文章
	欧阳城添
	江建慧
	王曦

关键词 ：软错误, 触发器, 可靠度评估, 概率转移矩阵, 半张量积

Abstract：

The traditional method based on probabilistic transfer matrices (PTM) enables accurate evaluation of reliability for moderately large combinational circuits,but it can only be applied to combinational circuits.Flip-flop is an important component of sequential circuits,and its reliability estimation is essential for reliability analysis of sequential circuits.Therefore,a general computational framework for reliability estimation of flip-flops based on PTM (F-PTM) and a decision theorem of circuit's PTM are proposed.Firstly,a logical function of the flip-flop circuit is expressed;and then its PTM is calculated by deduction employing the proposed decision theorem;finally,the circuit's reliability is estimated by probability distribution of its inputs.Compared with the traditional PTM method,the F-PTM method can calculate PTMs for both combinational circuits and flip-flop circuits.Experimental results of the classical flip-flop circuits and 74X series circuits show that the F-PTM method is efficient and feasible.The comparison of our method with multiple-pass method and Monte Carlo simulation also demonstrate that the reliability results estimated by the F-PTM method is more accurate.

Key words： soft error flip-flop reliability estimation probabilistic transfer matrix semi-tensor product

收稿日期: 2014-08-14

ZTFLH:

TP302.8

基金资助:

国家自然科学基金（No.61561024，No.61432017，No.61462034）；江西省教育厅项目（No.GJJ14429）；江西省自然科学项目（No.20151BAB207035）

通讯作者: 欧阳城添 E-mail: 2010oyct@tongji.edu.cn

作者简介: 江建慧 男,1964年生,浙江淳安人,博士,教授,博士生导师,主要研究领域为可信系统与网络、软件可靠性工程、VLSI/SoC测试与容错.E-mail:jhjiang@tongji.edu.cn;王曦女,1974年生,湖南双峰人,博士,主要研究领域为形式化方法、模型检测、高可信系统的安全性分析与评估.

引用本文:

欧阳城添, 江建慧, 王曦. 触发器可靠度计算的F-PTM方法[J]. 电子学报, 2016, 44(9): 2219-2226. OUYANG Cheng-tian, JIANG Jian-hui, WANG Xi. The F-PTM method of Reliability Estimation for Flip-Flops. Acta Electronica Sinica, 2016, 44(9): 2219-2226.

链接本文:

http://www.ejournal.org.cn/CN/10.3969/j.issn.0372-2112.2016.09.029 或 http://www.ejournal.org.cn/CN/Y2016/V44/I9/2219

[1] 王真,江建慧.基于概率转移矩阵的串行电路可靠度计算方法[J].电子学报,2009,37(2):241-247. Wang Z,Jiang J H.A serial method of circuit reliability calculation based on probabilistic transfer matrix[J].Acta Electronica Sinica,2009,37(2):241-247.(in Chinese)
[2] E Taylor,J Han,J Fortes.Towards accurate and efficient reliability modeling of nanoelectronic circuits[A].Proceedings ofSixth IEEE Conference on Nanotechnology[C].Ohio,USA:IEEE Computer Society,2006.395-398.
[3] J Han,E Taylor,J Gao,et al.Reliability modeling of nanoelectronic circuits[A].Proceedings of 5th IEEE Conference on Nanotechnology,2005[C].Nagoya,Japan:IEEE Computer Society,2005.104-107.
[4] G Norman,D Parker,M Kwiatkowska,et al.Evaluating the reliability of NAND multiplexing with PRISM[J].IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems,2005,24(10):1629-1637.
[5] 肖杰,江建慧,等.一个面向缺陷分析的电路成品率与可靠性的关系模型[J].电子学报,2014,(04):747-755. XIAO Jie;JIANG Jian-hui,et al.A defect analysis-oriented relation model of circuit yield and reliability[J].Acta Electronica Sinica,2005,24(10):1629-1637.(in Chinese)
[6] N Miskov-Zivanov,D Marculescu.Soft error rate analysis for sequential circuits[A].Proceedings of Design,Automation & Test in Europe Conference & Exhibition[C].Nice,France:IEEE Computer Society,2007.1-6.
[7] N Miskov-Zivanov,D Marculescu.Modeling and optimization for soft-error reliability of sequential circuits[J].IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems,2008,27(5):803-816.
[8] H Asadi,et al.Soft error modeling and protection for sequential elements[A].Proceedings of the 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems[C].Monterey,USA:IEEE Computer Society,2005.463-471.
[9] S J S Mahdavi,K Mohammadi.SCRAP:Sequential circuits reliability analysis program[J].Microelectronics Reliability,2009,49(7):924-933.
[10] M R Choudhury,K Mohanram.Accurate and scalable reliability analysis of logic circuits[A].Proceedings of IEEE/ACM Conference on Design,Automation & Test in Europe Conference & Exhibition,2007[C].Nice Acropolis,France:IEEE Computer Society,2007.1-6.
[11] M R Choudhury,K Mohanram.Reliability analysis of logic circuits[J].IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems,2009,28(3):392-405.
[12] K Lingasubramanian,S Bhanja.Probabilistic error modeling for sequential logic[A].Proceedings of the 7th IEEE Conference on Nanotechnology[C].Hong Kong:IEEE Computer Society,2007.616-620.
[13] K Lingasubramanian,S Bhanja.An error model to study the behavior of transient errors in sequential circuits[A].Proceedings of the 22nd International Conference on VLSI Design[C].New Delhi,India:IEEE Computer Society,2009.485-490.
[14] S Krishnaswamy,G F Viamontes,I L Markov,et al.Accurate reliability evaluation and enhancement via probabilistic transfer matrices[A].Proceedings of the IEEE/ACM Conference on Design,Automation and Test in Europe[C].Orlando,USA:IEEE Computer Society,2005.282-287.
[15] C Ouyang,j Jiang,j Xiao.Reliability evaluation of flip-flops based on probabilistic transfer matrices[A].Proceedings of the 16th IEEE Pacific Rim International Symposium on Dependable Computing(PRDC)[C].Tokyo:IEEE Computer Society,2010.239-240.
[16] D Cheng.Semi-tensor product of matrices and its application to Morgen's problem[J].Science in China Series F:Information Sciences,2001,44(3):195-212.
[17] 欧阳城添,江建慧.基于概率转移矩阵的时序电路可靠度计算方法[J].电子学报,2013,41(1):171-177. Ouyang C,Jiang J.Reliability estimation of sequential circuit based on probabilistic transfer matrices[J].Acta Electronica Sinica,2013,41(1):171-177.(in Chinese)