
32nm CMOS工艺三点翻转自恢复锁存器设计
黄正峰, 潘尚杰, 曹剑飞, 宋钛, 欧阳一鸣, 梁华国, 倪天明, 鲁迎春
电子学报 ›› 2021, Vol. 49 ›› Issue (2) : 394-400.
32nm CMOS工艺三点翻转自恢复锁存器设计
Design of Triple-Node-Upset Self-Recovery Latch in 32nm CMOS Technology
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