关键词: FPGA（Field Programmable Gate Array）, 部分重构, 单粒子翻转, 逐位注入, 三模冗余, 累积故障注入, 功能中断截面

Abstract:

The Virtex-5 series chips do not have an official soft error mitigation(SEM) IP core, so they need to design their own fault injection system.The XC5VFX130T field programmable gate array(FPGA) chip is selected to achieve the effect equivalent to SEM IP fault injection with the single-frame partial reconstruction function, and the single-event upset resistance of FPGA circuit system is evaluated and tested.The configuration bits of XC5VFX130T FPGA are injected one by one in bitwise injection fault mode to obtain the sensitive configuration bit information of the circuit to be evaluated.The test circuit was reinforced with three-mode redundancy protection, and the cumulative fault injection mode was used to simulate the single-particle irradiation test environment. The functional interruption section of the circuit to be evaluated was obtained, and then the anti-single-event upset reinforcement effect of XC5VFX130T FPGA system was evaluated.The study shows that the function interruption cross section of reference circuit such as shift register chain is consistent with the change of function interruption cross section curve of actual irradiation test, which provides support for the airworthiness evaluation of airborne electron with single event effect.

Key words: FPGA(Field Programmable Gate Array), partial reconstruction, single event upset, bit by bit injection, triple modular redundancy, cumulative fault injection, functional interruption cross section