电子系统电磁脉冲易损性评估的分层贝叶斯网络模型

doi:10.3969/j.issn.0372-2112.2016.11.019

电子学报 ›› 2016, Vol. 44 ›› Issue (11): 2695-2703.DOI: 10.3969/j.issn.0372-2112.2016.11.019

电子系统电磁脉冲易损性评估的分层贝叶斯网络模型

刘钰¹, 韩峰¹, 陆希成¹, 王建国^1,2

1. 西北核技术研究所第五研究室, 陕西西安 710024;
2. 西安交通大学电子与信息工程学院, 陕西西安 710049

收稿日期:2016-03-15 修回日期:2015-06-05 出版日期:2016-11-25
- 作者简介:
- 刘钰,男,1982年11月出生于陕西西安.西北核技术研究所博士研究生,西北核技术研究所助理研究员,研究方向为系统可靠性、系统辐射效应评估.E-mail:liuyu05@nint.ac.cn;韩峰,男,1975年8月出生于河南南阳.西北核技术研究所副研究员.研究方向为系统辐射效应评估,系统效能评估.E-mail:hanfeng@nint.ac.cn;陆希成,男,1977年12月出生于江苏徐州.西北核技术研究所助理研究员.主要从事高功率电磁环境效应研究工作.E-mail:luxicheng@nint.ac.cn;王建国,男,1965年12月出生于江苏.现为西北核技术研究所研究员,博士生导师,特聘为西安交通大学教授,博士生导师.主要从事瞬态电磁学,电磁场数值计算,天线设计和等离子物理等方面工作.E-mail:wanguiuc@mail.xjtu.edu.cn
- 基金资助:
- 国家自然科学重点基金 (No.61231003）; 国家自然科学基金青年基金 (No.61201090）

EMP Susceptibility Modeling and Assessment of Electronic System Based on Hierarchical Bayesian Networks

LIU Yu¹, HAN Feng¹, LU Xi-cheng¹, WANG Jian-guo^1,2

1. Department of No. 5, Northwest Institute of Nuclear Technology, Xi'an, Shaanxi 710024, China;
2. School of Electronic and Information Engineering, Xi'an Jiaotong University, Xi'an, Shaanxi 710049, China

Received:2016-03-15 Revised:2015-06-05 Online:2016-11-25 Published:2016-11-25

摘要/Abstract

摘要：

针对电子系统电磁脉冲易损性评估问题，提出了基于分层贝叶斯网络的电子系统电磁脉冲易损性评估模型建模方法.分析了电子系统分层结构特征及其电磁脉冲效应的特点，应用电磁拓扑理论中的相互作用顺序图分析系统电磁耦合途径，确定系统内底层屏蔽区域节点，研究了相互作用顺序图与系统分层贝叶斯网络的拓扑关联关系，在系统分层贝叶斯网络模型中增加底层屏蔽区域节点层，从而建立系统易损性评估模型，并给出了相应的建模步骤.最后以某电子机械传动系统电磁脉冲易损性评估问题为例说明了建模和计算过程.

关键词: 电磁脉冲, 敏感性, 易损性, 可靠性, 电子系统, 分层贝叶斯网络, 评估模型

Abstract:

A modeling method based on hierarchical Bayesian networks (HBN) which can be used in the susceptibility assessment of electronic system interfered by electromagnetic pulse (EMP) is proposed.According to the hierarchical structure of the electronic system and the feature of its EMP effects,steps to assess the system susceptibility are discussed.Analyzing the couple path by using the interaction sequence diagram (ISD),and the proper volume nodes of the base level of the ISD and the probability distribution of the electromagnetic stress in these nodes are determined.The topology relationship between the HBN and ISD is created by adding the directed arc from the base proper volume nodes of the ISD to the root nodes of HBN.The base proper volume level is considered as new root level to rebuild the HBN of system which can be used as the susceptibility assessment model of electronic system interfered by EMP.A case study demonstrates the effectiveness of the proposed methodology.

Key words: electromagnetic pulse(EMP), susceptibility, vulnerability, reliability, electronic system, hierarchical Bayesian networks, assessment model

中图分类号:

TN07
N945.17

刘钰, 韩峰, 陆希成, 王建国. 电子系统电磁脉冲易损性评估的分层贝叶斯网络模型[J]. 电子学报, 2016, 44(11): 2695-2703.

LIU Yu, HAN Feng, LU Xi-cheng, WANG Jian-guo. EMP Susceptibility Modeling and Assessment of Electronic System Based on Hierarchical Bayesian Networks[J]. Acta Electronica Sinica, 2016, 44(11): 2695-2703.

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电子系统电磁脉冲易损性评估的分层贝叶斯网络模型

EMP Susceptibility Modeling and Assessment of Electronic System Based on Hierarchical Bayesian Networks

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