电子学报 ›› 2020, Vol. 48 ›› Issue (8): 1623-1630.DOI: 10.3969/j.issn.0372-2112.2020.08.022

• 学术论文 • 上一篇    下一篇

一种集成电路测试流程分级动态调整方法

詹文法, 邵志伟   

  1. 安庆师范大学计算机与信息学院, 安徽安庆 246133
  • 收稿日期:2019-07-27 修回日期:2020-01-21 出版日期:2020-08-25 发布日期:2020-08-25
  • 作者简介:詹文法 男,1978年生,博士,教授,安庆师范大学硕士研究生导师,主要研究方向为自适应测试、测试数据压缩等. E-mail:zhanwf@aqnu.edu.cn;邵志伟 男,2017年于安庆师范大学获得学士学位,现为安庆师范大学硕士研究生,主要研究方向为自适应测试算法. E-mail:szv0421@qq.com
  • 基金资助:
    安徽省高校协同创新项目(No.GXXT-2019-030);安徽省技术带头人及后备人选(No.gxbjZD2016075,No.2015H053);国家自然科学基金(No.61306046,No.61640421)

Hierarchical Dynamic Adjustment Method for Integrated Circuit Testing Process

ZHAN Wen-fa, SHAO Zhi-wei   

  1. School of Computer and Information, Anqing Normal University, Anqing, Anhui 246133, China
  • Received:2019-07-27 Revised:2020-01-21 Online:2020-08-25 Published:2020-08-25

摘要: 针对集成电路测试过程中测试时间长,影响测试效率的问题,提出了一种集成电路测试流程分级动态调整方法.通过统计样本集成电路中每种测试类型和每条测试向量的测试故障率来建立贝叶斯概率模型,根据其命中故障点的概率高低分级调整它们的加载顺序.随着测试的进行,不断收集测试数据,动态更新测试类型和测试向量的测试故障率,同步调整测试类型以及测试向量的加载顺序.实验表明,使用动态调整后的测试流程可以更早的发现故障电路,显著减少故障电路的测试时间,提高测试效率.本算法是完全基于软件的,不需要增加硬件开销,可以相容于传统的集成电路测试流程.

关键词: 自适应测试, 测试类型排序, 测试向量排序, 贝叶斯统计, 泊松分布

Abstract: Aiming at the problem of long test time and affecting test efficiency in integrated circuit testing process,a hierarchical dynamic adjustment method for integrated circuit testing process was proposed.The Bayesian probability model was established by counting the test failure rate of each test type and each test vector in the sample integrated circuit,and the testing process is hierarchically adjusted according to the probability of their hit fault.With the test progressed,the test data was collected continuously,the test failure rate of test type and vector were updated dynamically,and their loading order was adjusted synchronously.The experimental results showed that the proposed method could significantly reduce test time and improve test efficiency.Furthermore,the proposed algorithm is completely based on software,no additional hardware overhead,and can be compatible with the traditional integrated circuit testing process.

Key words: adaptive test, test type reordering, test pattern reordering, Bayesian statistics, Poisson distribution

中图分类号: