本文在交迭测试体系 的基础上提出了一种多扫描链的区间构造法,对于确定的测试向量集能够显著地减少测试应用时间.该构造方法根据规定的扫描链数,通过求解线性规划问题的方法确定扫描寄存器在扫描链上的优化的分布区间,从而构造多扫描链,最后根据对多扫描链进行连线复杂度的定性分析,求得连线复杂度最低的多扫描链的最优构造.

Based on the overlapped test scheme this paper proposes a region configuration method of multiple scan chains.According to the given number of scan chains we can obtain optimum region of the registers in scan chain by solving the linear programming problems,and sequentially construct the multiple scan chains.For the fixed set of test vectors,test application time is reduced very much when testied by use of multiple scan chains constructed by the method.Lastly the best configuration of multiple scan chains that have minimal routing complexity can be obtained with according to the qualitative analysis of the routing complexity of multiple scan chains.