[1] BS EN 61000-4-4:2012 Electromagnetic compatibility (EMC)-part4-4:Testing and measurement techniques-Electrical fast transient/burst immunity test[S].
[2] Fontana M,Hubing T H.Characterization of CAN network susceptibility to EFT transient noise[J].IEEE Transactions on Electromagnetic Compatibility,2015,57(2):188-194.
[3] Zhang J,Koo J,Moseley R,Herrin S,Li X,Pommerenke D,Beetner D G.Modeling injection of electrical fast transients into power and IO pins of ICs[J].IEEE Transactions on Antennas & Propagation,2014,56(6):1576-1584.
[4] Cori G,De Leo R,Primiani V M.Investigation of radiated susceptibility during EFT tests[J].IEEE Transactions on Electromagnetic Compatibility,1997,39(4):298-303.
[5] Cerri G,Leo R D,Primiani V M.Electrical fast-transient test:conducted and radiated disturbance determination by a complete source modeling[J].IEEE Transactions on Electromagnetic Compatibility,2001,43(1):37-44.
[6] Zhong Z,Tan J,Ye F,Zeng D.Numerical analysis of the electrical fast transient coupling between cables[A].7th Asia-Pacific Conference on Environmental Electromagnetics[C].Hangzhou,China,2015.69-72.
[7] 翟爱斌,陈向跃,吴宏志,孙蓓云,聂鑫.单片机传输系统EMP损伤函数研究[J].电波科学学报,2011,26(Z):141-146. Zhai Aibin,Chen Xiangyue,Wu Hongzhi,et al.Research on EMP-damage fuction of MCU transmission system[J].Chinese Journal of Radio Science,2011,26(Z):141-146.(in Chinese)
[8] 黄忠胜,陈宇浩,杨明,李科杰,祁国成,吕峰,谢萍,刘青,谢彦召.基于贝叶斯方法的设备级电磁脉冲效应评估[J].强激光与粒子束,2015,27(12):237-241. Huang Zhongsheng,Chen Yuhao,Yang Ming,et al.Effect assessmentof electromagnetic pulse at equipment level based on bayesian method[J].High Power Laser and Particle Beams,2015,27(12):237-241.(in Chinese)
[9] 刘钰,韩峰,陆希成,王建国.电子系统电磁脉冲易损性评估的分层贝叶斯网络模型[J].电子学报,2016,44(11):2695-2703. Liu Yu,Han Feng,Lu Xicheng,Wang Jianguo.EMP susceptibility modeling and assessment of electronic system based on hierarchical bayesian networks[J].Acta Electronica Sinica,2016,44(11):2695-2703.(in Chinese)
[10] Mao C,Canavero F.System-level vulnerability assessment for EME:from fault tree analysis to bayesian networks-Part I:methodology framework[J].IEEE Transactions on Electromagnetic Compatibility,2016,58(1):180-187.
[11] Mao C,Canavero F G,Cui Z,Sun D.System-level vulnerability assessment for EME:from fault tree analysis to bayesian networks-Part Ⅱ:illustration to microcontroller system[J].IEEE Transactions on Electromagnetic Compatibility,2015,99(2):1-9.
[12] 杨谋存,聂宏.三参数Weibull分布参数的极大似然估计数值解法[J].南京航空航天大学学报,2007,39(1):22-25. Yang Moucun,Nie Hong.Advanced algorithm for maximum likelihood estimation of three parameter weibull distribution[J].Journal of Nanjing University of Aeronautics & Astronautics,2007,39(1):22-25.(in Chinese)
[13] 茆诗松,吕晓玲,数理统计学[M].北京:中国人民大学出版社,2011.
[14] Tu S,Xu L.A theoretical investigation of several model selection criteria for dimensionality reduction[J].Pattern Recognition Letters,2012,33(9):1117-1126.
[15] 戴前伟,江沸菠,董莉.基于汉南-奎因信息准则的电阻率层析成像径向基神经网络反演[J].地球物理学报,2014,57(4):1335-1344. Dai Qianwei,Jiang Feibo,Dong Li.RBFNN inversion for electrical resistivity tomography based on Hannan-quinn criterion[J].Chinese Journal of Geophysics,2014,57(4):1335-1344.(in Chinese)
[16] Chen P,Wu T J,Yang J.A comparative study of model selection criteria for the number of signals[J].IET Radar,Sonar & Navigation,2008,2(3):180-188.
[17] Mariani A,Giorgetti A,Chiani M.Model order selection based on information theoretic criteria:design of the penalty[J].IEEE Transactions on Signal Processing,2015,63(11):2779-2789.
[18] 刘进,陈永光,谭志良,陈京平.集成电路不同脉冲注入的损伤效应相关性[J].高电压技术,2011,37(7):1740-1745. Liu Jin,Chen Yongguang,Tan Zhiliang,Chen Jingping.Correlation of the damage effect of intergrated circuits injected by different impulses[J].High Voltage Engineering,2011,37(7):1740-1745.(in Chinese) |