磁头内置DFH控制元件可靠性的有限元分析

doi:10.3969/j.issn.0372-2112.2012.10.040

电子学报 ›› 2012, Vol. 40 ›› Issue (10): 2140-2144.DOI: 10.3969/j.issn.0372-2112.2012.10.040

• 科研通信 • 上一篇

磁头内置DFH控制元件可靠性的有限元分析

肖祥慧¹, 彭敏放¹, 黎福海¹, 詹杰², 唐荣军³

1. 湖南大学电气与信息工程学院, 湖南长沙 410082;
2. 湖南科技大学物理学院, 湖南湘潭 411201;
3. 日本TDK集团, 广东东莞 523000

收稿日期:2011-12-17 修回日期:2012-03-23 出版日期:2012-10-25
- 作者简介:
- 肖祥慧 男.1983年9月出生,湖南邵阳人.湖南大学电气与信息工程学院电气工程专业博士研究生.主要从事接地网故障诊断,智能电网、电磁场理论及其应用,智能信息处理等方面的研究工作. E-mail:xiaoen3@126.com 彭敏放 女.1964年3月生,湖南湘乡人.1991年、2006年分别在湖南大学获得工学硕士和工学博士学位.现为湖南大学电气与信息工程学院教授、博士生导师,湖南省新世纪121人才工程人选,主要从事电路测试与诊断、智能信息处理、电力系统故障分析及其设备状态监测、电磁场理论及其应用等方面的研究工作. E-mail:pengminfang@hnu.edu.cn
- 基金资助:
- 国家自然科学基金 (No.60775047,No.60973032,No.60673084); 湖南省自然科学基金 (No.10JJ2045); 湖南省学位与研究生教育教改资金 (No.JG2011C004)

The Finite Element Analysis for Reliability of Built-DFH in Magnetic Head

XIAO Xiang-hui¹, PENG Min-fang¹, LI Fu-hai¹, ZHAN Jie², TANG Rong-jun³

1. Institute of Elec and Information Engineering in Hunan University, Changsha, Hunan 410082, China;
2. School of Physics in Hunan University of Science & Technology, Xiangtan, Hunan 411201, China;
3. Japan's TDK Groups, Dongguan, Guangdong 523000, China

Received:2011-12-17 Revised:2012-03-23 Online:2012-10-25 Published:2012-10-25
- Supported by:
- National Natural Science Foundation of China (No.60775047, No.60973032, No.60673084); Natural Science Foundation of Hunan Province, China (No.10JJ2045); Fund for Degree and Postgraduate Education Reform Research Project of Hunan Province (No.JG2011C004)

摘要/Abstract

摘要： 磁头内置DFH控制元件的可靠性设计评估十分重要,目前工艺上多采用经验数据指导的方法,误差十分大,理论上是根据传统流体力学的基本原理,利用Matlab软件实现模拟评估的,由于元件尺寸限制,模拟算法会随着舍入误差的叠加而失效.本文使用ANSYS软件,通过实验获得建立模型的基本参数,选择了合适的单元类型、材料属性,给出了磁头的有限元模型.利用模型对元件进行的寿命预测实验表明,有限元模型分析DFH控制元件的设计可靠性问题是有效的,并且得出以下结论:在50Ω的新型DFH计算结果中,其热效应强度比传统屏蔽层大10%以上,实际的寿命失败样品问题区域都在线路的转角处.

关键词: DFH, 可靠性分析, 有限元, 热效应, 电流拥挤效应

Abstract: The assessment for the reliability design of Built-DFH in Magnetic head is very important.It recurrently uses the empirical data to instruct the production in the craft now.Unfortunately,the error is very large.Theoretically,everybody is simulating the reliability using the Matlab software.Owing to the limit of the cell size,the simulation algorithm will expire along with the rounding error superimposition.This article uses the ANSYS software.The experiment was to establish the basic parameters and select the appropriate cell type,material properties and give the finite element model of the head.The results according to the life prediction using the model above shows,the finite element model is effective.Furthermore,in new DFH in 50Ω,the strength of thermal effects is larger above 10% than the traditional shield.The regions with problems of the actual life failed samples are in the line of the corner.

Key words: Dynamic Flying Height, reliability analysis, finite element, thermal effects, current crowded effect

中图分类号:

TM271+.2

肖祥慧, 彭敏放, 黎福海, 等. 磁头内置DFH控制元件可靠性的有限元分析[J]. 电子学报, 2012, 40(10): 2140-2144.

XIAO Xiang-hui, PENG Min-fang, LI Fu-hai, et al. The Finite Element Analysis for Reliability of Built-DFH in Magnetic Head[J]. Acta Electronica Sinica, 2012, 40(10): 2140-2144.

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磁头内置DFH控制元件可靠性的有限元分析

The Finite Element Analysis for Reliability of Built-DFH in Magnetic Head

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