电子学报 ›› 2013, Vol. 41 ›› Issue (1): 171-177.DOI: 10.3969/j.issn.0372-2112.2013.01.30

• 科研通信 • 上一篇    下一篇

基于概率转移矩阵的时序电路可靠度估计方法

欧阳城添1,2, 江建慧1   

  1. 1. 同济大学软件学院,上海 201804;
    2. 江西理工大学信息工程学院,江西赣州 341000
  • 收稿日期:2012-02-24 修回日期:2012-10-23 出版日期:2013-01-25
    • 作者简介:
    • 欧阳城添 男,1975年生,博士研究生,主要研究领域为容错计算、高层电路可靠性评估. E-mail:2010oyct@tongji.edu.cn 江建慧 男,1964年生,博士,教授,博士生导师,主要研究领域为可信系统与网络、软件可靠性工程、VLSI/SoC测试与容错. E-mail:jhjiang@tongji.edu.cn
    • 基金资助:
    • 国家自然科学基金 (No.60903033)

Reliability Estimation of Sequential Circuit Based on Probabilistic Transfer Matrices

OUYANG Cheng-tian1,2, JIANG Jian-hui1   

  1. 1. School of Software Engineering, Tongji University, Shanghai 201804, China;
    2. Faculty of Information Engineering, Jiangxi University of Science and Technology, Ganzhou, Jiangxi 341000, China
  • Received:2012-02-24 Revised:2012-10-23 Online:2013-01-25 Published:2013-01-25
    • Supported by:
    • National Natural Science Foundation of China (No.60903033)

摘要: 传统的概率转移矩阵(Probabilistic Transfer Matrix,PTM)方法是一种能够比较精确地估计软差错对门级电路可靠度影响的方法,但现有的方法只适用于组合逻辑电路的可靠度估计.本文提出基于PTM的时序电路可靠度估计方法(reliability estimation of Sequential circuits based on PTM,S-PTM),先把待评估时序电路划分为输出逻辑模块和次态逻辑模块,然后用本文提出的时序电路PTM计算模型得到电路的PTM,最后根据输入信号的概率分布计算出时序电路的可靠度.用ISCAS 89基准电路为对象进行实验和验证,实验表明所提方法是准确和合理的.

关键词: 软差错, 时序电路, 可靠度估计, 概率转移矩阵, 半张量积

Abstract: Traditional method based on probabilistic transfer matrices (PTM) for estimate the effects of soft errors on gate level circuit reliability can only be used for combinational circuits.In this paper,a method for reliability estimation of sequential circuit based on PTM (S-PTM) is proposed.A sequential circuitis divided into an output logic module and a next state logic module,then the PTM of the sequential circuit is calculated by deduction employing the proposed PTM calculation model for sequential circuits in the paper.Considering probability distribution of the circuit inputs,the reliability of overall circuit is estimated.Experimental results on ISCAS 89 benchmark circuits show that our method is efficient.

Key words: soft error, sequential circuit, reliability estimation, probabilistic transfer matrix, semi-tensor product

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