基于概率转移矩阵的时序电路可靠度估计方法

doi:10.3969/j.issn.0372-2112.2013.01.30

电子学报 ›› 2013, Vol. 41 ›› Issue (1): 171-177.DOI: 10.3969/j.issn.0372-2112.2013.01.30

基于概率转移矩阵的时序电路可靠度估计方法

欧阳城添^1,2, 江建慧¹

1. 同济大学软件学院,上海 201804;
2. 江西理工大学信息工程学院,江西赣州 341000

收稿日期:2012-02-24 修回日期:2012-10-23 出版日期:2013-01-25
- 作者简介:
- 欧阳城添 男,1975年生,博士研究生,主要研究领域为容错计算、高层电路可靠性评估. E-mail:2010oyct@tongji.edu.cn 江建慧 男,1964年生,博士,教授,博士生导师,主要研究领域为可信系统与网络、软件可靠性工程、VLSI/SoC测试与容错. E-mail:jhjiang@tongji.edu.cn
- 基金资助:
- 国家自然科学基金 (No.60903033)

Reliability Estimation of Sequential Circuit Based on Probabilistic Transfer Matrices

OUYANG Cheng-tian^1,2, JIANG Jian-hui¹

1. School of Software Engineering, Tongji University, Shanghai 201804, China;
2. Faculty of Information Engineering, Jiangxi University of Science and Technology, Ganzhou, Jiangxi 341000, China

Received:2012-02-24 Revised:2012-10-23 Online:2013-01-25 Published:2013-01-25
- Supported by:
- National Natural Science Foundation of China (No.60903033)

摘要/Abstract

摘要： 传统的概率转移矩阵(Probabilistic Transfer Matrix,PTM)方法是一种能够比较精确地估计软差错对门级电路可靠度影响的方法,但现有的方法只适用于组合逻辑电路的可靠度估计.本文提出基于PTM的时序电路可靠度估计方法(reliability estimation of Sequential circuits based on PTM,S-PTM),先把待评估时序电路划分为输出逻辑模块和次态逻辑模块,然后用本文提出的时序电路PTM计算模型得到电路的PTM,最后根据输入信号的概率分布计算出时序电路的可靠度.用ISCAS 89基准电路为对象进行实验和验证,实验表明所提方法是准确和合理的.

关键词: 软差错, 时序电路, 可靠度估计, 概率转移矩阵, 半张量积

Abstract: Traditional method based on probabilistic transfer matrices (PTM) for estimate the effects of soft errors on gate level circuit reliability can only be used for combinational circuits.In this paper,a method for reliability estimation of sequential circuit based on PTM (S-PTM) is proposed.A sequential circuitis divided into an output logic module and a next state logic module,then the PTM of the sequential circuit is calculated by deduction employing the proposed PTM calculation model for sequential circuits in the paper.Considering probability distribution of the circuit inputs,the reliability of overall circuit is estimated.Experimental results on ISCAS 89 benchmark circuits show that our method is efficient.

Key words: soft error, sequential circuit, reliability estimation, probabilistic transfer matrix, semi-tensor product

中图分类号:

TP302.8

欧阳城添, 江建慧. 基于概率转移矩阵的时序电路可靠度估计方法[J]. 电子学报, 2013, 41(1): 171-177.

OUYANG Cheng-tian, JIANG Jian-hui . Reliability Estimation of Sequential Circuit Based on Probabilistic Transfer Matrices[J]. Acta Electronica Sinica, 2013, 41(1): 171-177.

参考文献

[1] S S Mukherjee,J Emer,S K Reinhardt.The soft error problem:An architectural perspective[A].Proceedings of the 11th International Symposium on High-Performance Computer Architecture[C].Washington,DC,USA:IEEE Computer Society,2005.243-247.
[2] J F Ziegler,H W Curtis,H P Muhlfeld,et al.IBM experiments in soft fails in computer electronics (1978-1994)[J].IBM Journal of Research and Development,1996,40(1):3-18.
[3] T C May,M H Woods.Alpha-particle-induced soft errors in dynamic memories[J].IEEE Transactions on Electron Devices,1979,26(1):2-9.
[4] N Miskov-Zivanov,D Marculescu.Soft error rate analysis for sequential circuits [A].Proceedings of Design,Automation & Test in Europe Conference & Exhibition[C].Nice,France:IEEE Computer Society,2007.1-6.
[5] N Miskov-Zivanov,D Marculescu.Modeling and optimization for soft-Error reliability of sequential circuits[J].IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems,2008,27(5):803-816.
[6] H Asadi,M B Tahoori.Soft error modeling and protection for sequential elements [A].Proceedings of 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems[C].Monterey,USA:IEEE Computer Society,2005.463-471.
[7] D Holcomb,L Wenchao,S A Seshia.Design as you see FIT:System-level soft error analysis of sequential circuits[A].Proceedings of Design,Automation & Test in Europe Conference & Exhibition[C].Nice,France:IEEE Computer Society,2009.785-790.
[8] S J S Mahdavi,K Mohammadi.SCRAP:Sequential circuits reliability analysis program[J].Microelectronics Reliability,2009,49(7):924-933.
[9] K Lingasubramanian,S Bhanja.Probabilistic error modeling for sequential logic[A].Proceedings of 7th IEEE Conference on Nanotechnology[C].Hong Kong:IEEE Computer Society,2007.616-620.
[10] K Lingasubramanian,S Bhanja.An error model to study the behavior of transient errors in sequential circuits[A].Proceedings of 22nd International Conference on VLSI Design[C].New Delhi,India:IEEE Computer Society,2009.485-490.
[11] S Krishnaswamy,G F Viamontes,I L Markov,et al.Accurate reliability evaluation and enhancement via probabilistic transfer matrices[A].Proceedings of IEEE/ACM Conference on Design,Automation and Test in Europe[C].Orlando,USA:IEEE Computer Society,2005.282-287.
[12] 王真,江建慧等.基于概率转移矩阵的电路可靠性并行计算方法[J].小型微型计算机系统,2008,29(2):357-360.Z Wang,J H Jiang.Parallel processing of the probabilistic transfer matrix based circuits reliability calculation[J].Journal of Chinese Computer Systems,2008,28(2):357-360.(in Chinese)
[13] 王真,江建慧.基于概率转移矩阵的串行电路可靠度计算方法[J].电子学报,2009,37(2):241-247.Z Wang,J H Jiang.A serial method of circuit reliability calculation based on probabilistic transfer matrix[J].Acta Electronica Sinica,2009,37(2):241-247.(in Chinese)
[14] V L Levin.Probability analysis of combination systems and their reliability[J].Engin Cybernetics,1996,11(6):78-84.
[15] D Cheng.Semi-tensor product of matrices and its application to Morgen's problem[J].Science in China Series F:Information Sciences,2001,44(3):195-212.
[16] D Cheng,H Qi,A Xue.A Survey on semi-tensor product of matrices[J].Journal of Systems Science and Complexity,2007,2007(20):304-322.
[17] C Ouyang,J Jiang,J Xiao.Reliability evaluation of flip-flops based on probabilistic transfer matrices[A]Proceedings of Proceedings of the 2010 IEEE 16th Pacific Rim International Symposium on Dependable Computing[C].Tokyo,Japan:IEEE Computer Society,2010.239-240.
[18] 徐拾义.可信计算系统设计和分析[M].北京:清华大学出版社,2006.S Y Xu.Trusted Computing System Design and Analysis[M].Beijing:TsingHua University Press,2006.(in Chinese)

基于概率转移矩阵的时序电路可靠度估计方法

Reliability Estimation of Sequential Circuit Based on Probabilistic Transfer Matrices

PDF

可视化

摘要/Abstract

引用本文

使用本文

参考文献

相关文章 8

编辑推荐

Metrics

[1]	吴钰, 王伦耀, 储著飞, 夏银水. 一种功能可配置的可逆触发器设计[J]. 电子学报, 2022, 50(6): 1466-1471.
[2]	吴钰, 张莹, 王伦耀, 储著飞, 夏银水. 一种可逆有限状态机的电路设计[J]. 电子学报, 2020, 48(11): 2226-2232.
[3]	孙梦博, 吕洪君, 张永强, 解光军. 量子元胞自动机全加器的性能分析与设计[J]. 电子学报, 2018, 46(7): 1774-1780.
[4]	王金铭, 叶时平, 徐振宇, 陈超祥, 蒋燕君. 半张量积低存储压缩感知方法研究[J]. 电子学报, 2018, 46(4): 797-804.
[5]	杜化鲲, 吕洪君, 黄程, 张永强, 解光军. 基于QCA的双边沿JK触发器的实现[J]. 电子学报, 2017, 45(8): 2044-2048.
[6]	欧阳城添, 江建慧, 王曦. 触发器可靠度计算的F-PTM方法[J]. 电子学报, 2016, 44(9): 2219-2226.
[7]	王真;江建慧. 基于概率转移矩阵的串行电路可靠度计算方法[J]. 电子学报, 2009, 37(2): 241-247.
[8]	卢君明;林争辉. CMOSVLSI电路最大功耗估计[J]. 电子学报, 2001, 29(5): 630-633.