[1] I Kim,Y Zorian,G Komoriya,H Pham,FP Higgins,JL Lweandowski.Built in self repair for embedded high density SRAM [A].Proceedings of International Test Conference (ITC) [C].USA:IEEE,1998.1112-1119.[2] 陈则王,苏建华,王友仁.嵌入式SRAM测试算法及其诊断实现[J].计算机辅助设计与图形学学报,2010,22(5):865-870. Chen Zewang,Su Jianhua,Wang Youren.Test algorithm and diagnosis implementation for embedded SRAM[J].Journal of Computer-Aided Design & Computer Graphics,2010,22(5):865-870.(in Chinese)[3] 付祥,王达,李华伟,胡瑜,李晓维.一种嵌入式存储器的内建自修复机制 [A].第四届中国测试学术会议论文集 [C].河北秦皇岛,2006.15-19.[4] SK Lu,YC Tsai,CH Hsu,KH Wang,CW Wu.Efficient built-in redundancy analysis for embedded memories with 2-D redundancy[J].IEEE Transaction on VLSI Systems,2006,14(1):34-42.[5] TW Tseng,JF Li,DM Chang.A built-in redundancy-analysis scheme for RAMs with 2D redundancy using 1D local bitmap [A].Proceedings of Conference Design Automation and Test [C].Europe (DATE):Munich,2006.53-58.[6] 苏建华,陈则王,王友仁,姚睿.嵌入式SRAM的一种高可靠性内建冗余分析策略研究[J].宇航学报,2010,31(11):2597-2603. Su Jianhua,Chen Zewang,Wang Youren,Yao Rui.Higher reliability built-in redundancy analysis strategy for embedded SRAM[J].Journal of Astronautics,2010,31(11):2597-2603.(in Chinese)[7] V Schober,S Paul,O Picot.Memory built-in self-repair using redundant words [A].Proceedings of International Test Conference(ITC) [C].Baltimore,2001.995-1001.[8] 俞洋,李嘉铭,乔立岩.基于地址分割的嵌入式存储器内建自修复方法[J].电子学报,2010,38(2A):169-173. Yu Yang,Li Jiaming,Qiao Liyan.Memory built-in self-repair method based on address partitioning strategy[J].Acta Electronica Sinica,2010,38(2A):169-173.(in Chinese)[9] 谢远江,王达,胡瑜,李晓维.利用内容可寻址技术的存储器BISR方法[J].计算机辅助设计与图形学报,2009,21(4):467-473. Xie Yuanjiang,Wang Da,Hu Yu,Li Xiaowei.Memory BISR based on content addressable memory[J].Journal of Computer-Aided Design & Computer Graphics,2009,21(4):467-473.(in Chinese)[10] 赵天绪,郝跃.集成电路局部缺陷模型及其相关的功能成品率分析[J].微电子学,2001,31(2):138-142. Zhao Tianxu,Hao Yue.A local defect model of IC’s and analysis of its related functional yield[J].Microelectronics,2001,31(2):138-142.(in Chinese)[11] 郝跃,朱春翔,刘志镜.集成电路硅片上缺陷空间分布的分形表征[J].电子学报,1996,24(8):10-14. Hao Yue,Zhu Chunxiang,Liu Zhijing.The fractal description of the defect spatial distributions on the wafer of integrated circuits[J].Acta Electronica Sinica,1996,24(8):10-14.(in Chinese)[12] C T Huang,C F Wu,J F Li,C W Wu.Built-in redundancy analysis for memory yield improvement [J].IEEE Transaction on Reliability,2003,52(4):386-399. |