基于哈希表的高效存储器内建自修复方法

doi:10.3969/j.issn.0372-2112.2013.07.020

电子学报 ›› 2013, Vol. 41 ›› Issue (7): 1371-1377.DOI: 10.3969/j.issn.0372-2112.2013.07.020

基于哈希表的高效存储器内建自修复方法

郭旭峰, 于芳, 刘忠立

中国科学院微电子研究所, 北京 100029

收稿日期:2012-05-04 修回日期:2013-02-27 出版日期:2013-07-25
- 作者简介:
- 郭旭峰 男,1983年1月生于黑龙江省哈尔滨市,2006年于北京航空航天大学获得工学学士学位,目前为中国科学院微电子研究所在读博士研究生,主要研究方向为基于LUT结构的FPGA综合工具开发以及存储器内建自修复技术.E-mail:phxwings@yahoo.com.cn;于芳女,生于1960年,中国科学院微电子研究所研究员、博士生导师,主要研究方向为基于SOI工艺抗辐射集成电路研究与设计,基于LUT结构的FPGA芯片及配套EDA工具开发等.E-mail:yufang@ime.ac.cn
- 基金资助:
- "核高基"国家重大科技专项 (No.Y1GZ212002)

An Efficient Memory Built-in Self-Repair Method Based on Hash Table

GUO Xu-feng, YU Fang, LIU Zhong-li

Institute of Microelectronics of Chinese Academy of Sciences, Beijing 100029, China

Received:2012-05-04 Revised:2013-02-27 Online:2013-07-25 Published:2013-07-25
- Supported by:
- National Science and Technology Major Project (NSTMP) Program Kernal Electronic Devices, High-end General Application Chips, Fundamental Software Products (No.Y1GZ212002)

摘要/Abstract

摘要： 现有存储器内建自修复方法要么遍历式地址比较效率低,要么并行地址比较功耗高,都不适用于大故障数存储器.对此,本文提出一种高效的存储器内建自修复方法,该方法对占故障主体的单元故障地址以哈希表形式进行存储,以利用哈希表的快速搜索特性提升地址比较效率.本文方法修复后的存储器在1个时钟周期内即可完成地址比较,修复后存储器性能不受任何影响,与目前广泛采用的基于CAM的方法处于同一水平,但功耗方面却具有明显优势.计算机模拟实验表明,对于512×512×8bits的存储器在同等冗余开销的情况下本文方法修复率相对于ESP方法平均提高了32.25%.

关键词: 内建自修复, 哈希表, 内建冗余分析, 内建自测试

Abstract: Existing built-in self-repair (BISR) methods are either inefficient using traversal address compare or high power consumption using parallel address compare.Neither is suitable for memories with large fault quantity.In order to solve this issue,an efficient memory BISR method based on hash table is proposed.In the proposed method cell fault addresses which contribute the main part of memory faults were stored in the form of a hash table.With quick search feature of hash table the proposed method improves address compare efficiency radically.Under work mode address compare process can be finished within 1 clock cycle,and this will ensure repaired memory against additional performance penalty.The proposed method achieves the same address compare efficiency to CAM based method with much lower power consumption.Experimental results show that for 512?512?8 bits memory the proposed method achieves 32.25% repair rate increment on average to ESP method with the same redundancy overhead.

Key words: built-in self-repair, hash table, built-in redundancy analysis, built-in self-test

中图分类号:

TP333

郭旭峰, 于芳, 刘忠立. 基于哈希表的高效存储器内建自修复方法[J]. 电子学报, 2013, 41(7): 1371-1377.

GUO Xu-feng, YU Fang, LIU Zhong-li . An Efficient Memory Built-in Self-Repair Method Based on Hash Table[J]. Acta Electronica Sinica, 2013, 41(7): 1371-1377.

参考文献

[1] I Kim,Y Zorian,G Komoriya,H Pham,FP Higgins,JL Lweandowski.Built in self repair for embedded high density SRAM [A].Proceedings of International Test Conference (ITC) [C].USA:IEEE,1998.1112-1119.
[2] 陈则王,苏建华,王友仁.嵌入式SRAM测试算法及其诊断实现[J].计算机辅助设计与图形学学报,2010,22(5):865-870. Chen Zewang,Su Jianhua,Wang Youren.Test algorithm and diagnosis implementation for embedded SRAM[J].Journal of Computer-Aided Design & Computer Graphics,2010,22(5):865-870.(in Chinese)
[3] 付祥,王达,李华伟,胡瑜,李晓维.一种嵌入式存储器的内建自修复机制 [A].第四届中国测试学术会议论文集 [C].河北秦皇岛,2006.15-19.
[4] SK Lu,YC Tsai,CH Hsu,KH Wang,CW Wu.Efficient built-in redundancy analysis for embedded memories with 2-D redundancy[J].IEEE Transaction on VLSI Systems,2006,14(1):34-42.
[5] TW Tseng,JF Li,DM Chang.A built-in redundancy-analysis scheme for RAMs with 2D redundancy using 1D local bitmap [A].Proceedings of Conference Design Automation and Test [C].Europe (DATE):Munich,2006.53-58.
[6] 苏建华,陈则王,王友仁,姚睿.嵌入式SRAM的一种高可靠性内建冗余分析策略研究[J].宇航学报,2010,31(11):2597-2603. Su Jianhua,Chen Zewang,Wang Youren,Yao Rui.Higher reliability built-in redundancy analysis strategy for embedded SRAM[J].Journal of Astronautics,2010,31(11):2597-2603.(in Chinese)
[7] V Schober,S Paul,O Picot.Memory built-in self-repair using redundant words [A].Proceedings of International Test Conference(ITC) [C].Baltimore,2001.995-1001.
[8] 俞洋,李嘉铭,乔立岩.基于地址分割的嵌入式存储器内建自修复方法[J].电子学报,2010,38(2A):169-173. Yu Yang,Li Jiaming,Qiao Liyan.Memory built-in self-repair method based on address partitioning strategy[J].Acta Electronica Sinica,2010,38(2A):169-173.(in Chinese)
[9] 谢远江,王达,胡瑜,李晓维.利用内容可寻址技术的存储器BISR方法[J].计算机辅助设计与图形学报,2009,21(4):467-473. Xie Yuanjiang,Wang Da,Hu Yu,Li Xiaowei.Memory BISR based on content addressable memory[J].Journal of Computer-Aided Design & Computer Graphics,2009,21(4):467-473.(in Chinese)
[10] 赵天绪,郝跃.集成电路局部缺陷模型及其相关的功能成品率分析[J].微电子学,2001,31(2):138-142. Zhao Tianxu,Hao Yue.A local defect model of IC’s and analysis of its related functional yield[J].Microelectronics,2001,31(2):138-142.(in Chinese)
[11] 郝跃,朱春翔,刘志镜.集成电路硅片上缺陷空间分布的分形表征[J].电子学报,1996,24(8):10-14. Hao Yue,Zhu Chunxiang,Liu Zhijing.The fractal description of the defect spatial distributions on the wafer of integrated circuits[J].Acta Electronica Sinica,1996,24(8):10-14.(in Chinese)
[12] C T Huang,C F Wu,J F Li,C W Wu.Built-in redundancy analysis for memory yield improvement [J].IEEE Transaction on Reliability,2003,52(4):386-399.

基于哈希表的高效存储器内建自修复方法

An Efficient Memory Built-in Self-Repair Method Based on Hash Table

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