基于性能退化的电子产品筛选试验设计

doi:10.3969/j.issn.0372-2112.2013.09.019

电子学报 ›› 2013, Vol. 41 ›› Issue (9): 1788-1793.DOI: 10.3969/j.issn.0372-2112.2013.09.019

基于性能退化的电子产品筛选试验设计

钟强晖¹, 张志华², 李大伟³

1. 海军工程大学装备经济管理系, 湖北武汉 430033;
2. 海军工程大学应用数学系, 湖北武汉 430033;
3. 海军工程大学兵器工程系, 湖北武汉 430033

收稿日期:2010-06-07 修回日期:2013-06-13 出版日期:2013-09-25
- 作者简介:
- 钟强晖 男,1978年1月生于福建省龙岩市.2011年毕业于海军工程大学兵器工程系,获博士学位,现为海军工程大学装备经济管理系讲师.目前研究方向为装备经济性和可靠性分析.E-mail:zqh1978117@126.com;张志华 男,1965年7月生于山东省菏泽市.现为海军工程大学应用数学系教授、博士生导师,目前研究方向为装备试验及可靠性评估.E-mail:zzi_li@sina.com

Screening Test Design for Electronics Based on Performance Degradation

ZHONG Qiang-hui¹, ZHANG Zhi-hua², LI Da-wei³

1. Dept.of Equipment Economics and Management, Naval University of Engineering, Wuhan, Hubei 430033, China;
2. Dept.of Applied Mathematics, Naval University of Engineering, Wuhan, Hubei4 30033, China;
3. Dept.of Weapon Engineering, Naval University of Engineering, Wuhan, Hubei 430033, China

Received:2010-06-07 Revised:2013-06-13 Online:2013-09-25 Published:2013-09-25

摘要/Abstract

摘要： 长寿命的电子产品在进行传统环境应力筛选试验时,为了剔除存在早期失效或缺陷的产品,需要将产品长时间置于应力环境下,然而这会对其中的合格品产生较大的老化影响.对于很多电子产品来说,失效是根据性能特征逐渐退化到某个临界值来判定的.为了缩短筛选试验时间,减少筛选应力对产品的老化影响,针对退化型失效产品,本文分析了退化正常产品和退化不正常产品的差异,假设待筛选产品的退化特征量分布为污染分布模型,并给出了一种筛选试验设计方法,利用污染分布的可识别性条件,结合对退化试验的分析确定模型系数,再基于退化数据的可靠性预测方法,确定筛选试验时间和筛选阀值.最后通过实例验证该试验设计的可行性.

关键词: 退化数据, 环境应力筛选, 污染分布, 非参数估计, 试验设计

Abstract: Long-life electronic products need to be put in stress environment for long durations in order that items with infant mortality or defects are weeded out from the products.However,long stress durations cause aging effects on good items.For some products,failures are defined in terms of performance characteristics degrading some critical values.For reducing durations and aging effects,this paper analyzes the difference between normally and abnormally degraded products,assumes the distribution of product degradation characteristic variable is contaminated distribution model,and presents a degradation screening test design.This design firstly ascertains the model coefficient using identifiable condition of contaminated distribution combined with the analysis of degradation test,and then ascertains screening duration and screening critical value.Lastly,this paper gives an example to illustrate the feasibility of the design.

Key words: degradation data, environmental stress screening, contaminated distribution, nonparameter estimation, test design

中图分类号:

钟强晖, 张志华, 李大伟. 基于性能退化的电子产品筛选试验设计[J]. 电子学报, 2013, 41(9): 1788-1793.

ZHONG Qiang-hui, ZHANG Zhi-hua, LI Da-wei. Screening Test Design for Electronics Based on Performance Degradation[J]. Acta Electronica Sinica, 2013, 41(9): 1788-1793.

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基于性能退化的电子产品筛选试验设计

Screening Test Design for Electronics Based on Performance Degradation

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